Issued Patents All Time
Showing 1–25 of 115 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11776992 | Trench capacitor having improved capacitance and fabrication method thereof | Geeng-Chuan Chern | 2023-10-03 |
| 11610893 | Method for fabricating semiconductor memory device with buried capacitor and fin-like electrodes | Geeng-Chuan Chern | 2023-03-21 |
| 11322500 | Stacked capacitor with horizontal and vertical fin structures and method for making the same | Geeng-Chuan Chern | 2022-05-03 |
| 11296090 | Semiconductor memory device with buried capacitor and fin-like electrodes | Geeng-Chuan Chern | 2022-04-05 |
| 11139368 | Trench capacitor having improved capacitance and fabrication method thereof | Geeng-Chuan Chern | 2021-10-05 |
| 11114442 | Semiconductor memory device with shallow buried capacitor and fabrication method thereof | Geeng-Chuan Chern | 2021-09-07 |
| 9318378 | Slot designs in wide metal lines | Yeow Kheng Lim, Alex See, Tae Jong Lee, David Vigar, Kin Leong Pey | 2016-04-19 |
| 9054107 | Reliable interconnect for semiconductor device | Fan Zhang, Xiaomei Bu, Jane Hui, Tae Jong Lee | 2015-06-09 |
| 8860142 | Method and apparatus to reduce thermal variations within an integrated circuit die using thermal proximity correction | Debora Chyiu Hyia Poon, Alex See, Francis Benistant, Benjamin Colombeau, Yun Ling Tan +1 more | 2014-10-14 |
| 8754447 | Strained channel transistor structure and method | Jin Ping Liu, Alex See, Mei Sheng Zhou | 2014-06-17 |
| 8716076 | Method for fabricating a semiconductor device having an epitaxial channel and transistor having same | Jinping Liu, Alex See, Mei Sheng Zhou | 2014-05-06 |
| 8664711 | Dielectric stack | Sung Mun Jung, Swee Tuck Woo, Sanford Chu | 2014-03-04 |
| 8624329 | Spacer-less low-K dielectric processes | Yong Meng Lee, Young Way Teh, Chung Woh Lai, Wenhe Lin, Khee Yong Lim +3 more | 2014-01-07 |
| 8598031 | Reliable interconnect for semiconductor device | Fan Zhang, Xiaomei Bu, Jane Hui, Tae Jong Lee | 2013-12-03 |
| 8572524 | Statistical optical proximity correction | Wenzhan Zhou, Meisheng Zhou, Zheng Zou | 2013-10-29 |
| 8546873 | Integrated circuit and method of fabrication thereof | Jinping Liu, Hai Cong, Binbin Zhou, Alex See, Mei Sheng Zhou | 2013-10-01 |
| 8541273 | Dielectric stack | Sung Mun Jung, Swee Tuck Woo, Sanford Chu | 2013-09-24 |
| 8536705 | Integrated circuit system with through silicon via and method of manufacture thereof | Pradeep Ramachandramurthy Yelehanka, Denise Tan, Chung Meng Lek, Thomas Thiam, Jeffrey Lam | 2013-09-17 |
| 8489945 | Method and system for introducing physical damage into an integrated circuit device for verifying testing program and its results | Zhihong Mai, Pik Kee Tan, Guo Chang Man, Jeffrey Lam | 2013-07-16 |
| 8405222 | Integrated circuit system with via and method of manufacture thereof | Hong Yu, Huang Liu, Feng Zhao, Meisheng Zhou | 2013-03-26 |
| 8354347 | Method of forming high-k dielectric stop layer for contact hole opening | Jianhui Ye, Huang Liu, Alex See, Wei Lu, Chun Hui Low +2 more | 2013-01-15 |
| 8339449 | Defect monitoring in semiconductor device fabrication | Barbara Fong Chin Lim, Keng Heng Lai, Tanya Yang, Victor Lim, Fang Hong Gn | 2012-12-25 |
| 8293544 | Method and apparatus to reduce thermal variations within an integrated circuit die using thermal proximity correction | Debora Chyiu Hyia Poon, Alex See, Francis Benistant, Benjamin Colombeau, Yun Ling Tan +1 more | 2012-10-23 |
| 8293545 | Critical dimension for trench and vias | Hai Cong, Yan Shan Li, Chun Hui Low, Yelehanka Ramachandramurthy Pradeep | 2012-10-23 |
| 8289508 | Defect detection recipe definition | Victor Lim, Rachel Yie Fang Wai, Fang Hong Gn | 2012-10-16 |