Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8339449 | Defect monitoring in semiconductor device fabrication | Barbara Fong Chin Lim, Keng Heng Lai, Tanya Yang, Victor Lim, Liang-Choo Hsia | 2012-12-25 |
| 8289508 | Defect detection recipe definition | Victor Lim, Rachel Yie Fang Wai, Liang-Choo Hsia | 2012-10-16 |
| 8178368 | Test chiplets for devices | Victor Lim, Rachel Yie Fang Wai, Liang-Choo Hsia | 2012-05-15 |
| 6586143 | Accurate wafer patterning method for mass production | Juan Boon Tan, Tak Yan Tse, Sajan Marokkey Raphael | 2003-07-01 |
| 5677238 | Semiconductor contact metallization | Sekar Ramamoorthy, Lap Chan, Che-Chia Wei | 1997-10-14 |