RW

Rongping Wang

Applied Materials: 18 patents #731 of 7,310Top 10%
Lam Research: 3 patents #812 of 2,128Top 40%
NU Ningbo University: 1 patents #45 of 130Top 35%
Overall (All Time): #194,017 of 4,157,543Top 5%
22
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11530156 Method for preparing all-solid-state photonic crystal fiber preforms by extrusion Xunsi Wang, Youren Dong, Shixun Dai, Qiuhua Nie, Xiange Wang +4 more 2022-12-20
11398369 Method and apparatus for actively tuning a plasma power source Siamak Salimian, Tom K. Cho 2022-07-26
11355325 Methods and systems for monitoring input power for process control in semiconductor process systems Ramesh Gopalan, Hemant P. Mungekar, Guomin Mao, Teryl Pratt 2022-06-07
11328900 Plasma ignition circuit Teryl Pratt, Guomin Mao, Andy Chuang 2022-05-10
10757797 Method and apparatus for gas abatement Jibing Zeng, David Muquing HOU, Michael S. Cox, Zheng Yuan, James L'HEUREUX 2020-08-25
10580626 Arcing detection apparatus for plasma processing Lin Zhang, Jian J. Chen, Michael S. Cox, Andrew V. LE 2020-03-03
10211030 Source RF power split inner coil to improve BCD and etch depth performance Ruizhe Ren, Jon C. Farr, Chethan Mangalore, Peter DEMONTE, Parthiban Balakrishna 2019-02-19
10187966 Method and apparatus for gas abatement Jibing Zeng, David Muquing HOU, Michael S. Cox, Zheng Yuan, James L'HEUREUX 2019-01-22
10176973 Method of cooling a composition using a hall effect enhanced capacitively coupled plasma source, an abatement system, and vacuum processing system Michael S. Cox, Brian T. West, Roger M. Johnson, Colin John Dickinson 2019-01-08
9767990 Apparatus for treating a gas in a conduit Jibing Zeng, Brian T. West, Manoj A. Gajendra 2017-09-19
9659757 Measuring and controlling wafer potential in pulsed RF bias processing Andras Kuthi, Stephen Hwang, James C. Vetter, Greg Eilenstine, Tuan Ngo 2017-05-23
9552967 Abatement system having a plasma source Michael S. Cox, Brian T. West, Roger M. Johnson, Colin John Dickinson 2017-01-24
9543124 Capacitively coupled plasma source for abating compounds produced in semiconductor processes Michael S. Cox, Brian T. West, Roger M. Johnson, Colin John Dickinson 2017-01-10
9378928 Apparatus for treating a gas in a conduit Jibing Zeng, Brian T. West, Manoj A. Gajendra 2016-06-28
9240308 Hall effect enhanced capacitively coupled plasma source, an abatement system, and vacuum processing system Michael S. Cox, Brian T. West, Roger M. Johnson, Colin John Dickinson 2016-01-19
9230780 Hall effect enhanced capacitively coupled plasma source Michael S. Cox, Brian T. West, Roger M. Johnson, Colin John Dickinson 2016-01-05
8753989 Method to increase tensile stress of silicon nitride films using a post PECVD deposition UV cure Mihaela Balseanu, Michael S. Cox, Li-Qun Xia, Mei-Yee Shek, Jia-Sheng Lee +4 more 2014-06-17
8728918 Method and apparatus for fabricating silicon heterojunction solar cells Shuran Sheng, Lin Zhang, Zheng Yuan, Alan Tso 2014-05-20
8303763 Measuring and controlling wafer potential in pulsed RF bias processing Andras Kuthi, Stephen Hwang, James C. Vetter, Greg Eilenstine, Tuan Ngo 2012-11-06
8192576 Methods of and apparatus for measuring and controlling wafer potential in pulsed RF bias processing Andras Kuthi, Stephen Hwang, James C. Vetter, Greg Eilenstine, Tuan Ngo 2012-06-05
8129290 Method to increase tensile stress of silicon nitride films using a post PECVD deposition UV cure Mihaela Balseanu, Michael S. Cox, Li-Qun Xia, Mei-Yee Shek, Jia-Sheng Lee +4 more 2012-03-06
7571698 Low-frequency bias power in HDP-CVD processes Canfeng Lai, Yuri Trachuk, Siamak Salimian 2009-08-11