Carsten Hartig — 14 Patents at AMD

Carsten Hartig has been granted 14 US patents while listed as an inventor at AMD. The first was granted in 2004 and the most recent in October 2018. Carsten Hartig ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Carsten Hartig in Meerane, DE.

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Showing 1–14 of 14 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
10115621	Method for in-die overlay control using FEOL dummy fill layer	Peter Moll, Martin Schmidt, Matthias Ruhm, Stefan Thierbach, Stefan Rongen +3 more	2018-10-30	$22,881,000
9177873	Systems and methods for fabricating semiconductor device structures	Alok Vaid, Lokesh Subramany	2015-11-03	$718,000
9171765	Inline residual layer detection and characterization post via post etch using CD-SEM	Daniel Fischer	2015-10-27	$712,000
9091667	Detection of particle contamination on wafers	Adam Michal Urbanowicz, Daniel Fischer	2015-07-28	$933,000
9029855	Layout for reticle and wafer scanning electron microscope registration or overlay measurements	Guo Xiang Ning, Paul Ackmann, Fanghong Gn	2015-05-12
8892237	Systems and methods for fabricating semiconductor device structures using different metrology tools	Alok Vaid	2014-11-18	$1,887,000
7663766	Incorporating film optical property measurements into scatterometry metrology	Jason P. Cain	2010-02-16	$19,031,000
7410885	Method of reducing contamination by removing an interlayer dielectric from the substrate edge	Holger Schuehrer, Christin Bartsch	2008-08-12	$9,390,000
7259091	Technique for forming a passivation layer prior to depositing a barrier layer in a copper metallization layer	Holger Schuehrer, Christin Bartsch, Kai Frohberg	2007-08-21	$20,186,000
7098140	Method of compensating for etch rate non-uniformities by ion implantation	Matthias Schaller, Christoph Schwan	2006-08-29	$13,087,000
6936383	Method of defining the dimensions of circuit elements by using spacer deposition techniques	Martin Mazur, Georg Sulzer	2005-08-30	$5,346,000
6838010	System and method for wafer-based controlled patterning of features with critical dimensions	Gunter Grasshoff	2005-01-04	$7,312,000
6724096	Die corner alignment structure	Thomas Werner, Gunter Grasshoff, Bernd Schulz	2004-04-20	$2,632,000
6720242	Method of forming a substrate contact in a field effect transistor formed over a buried insulator layer	Gert Burbach, Frank Heinlein, Johannes Groschopf, Gotthard Jungnickel, Hartmut Ruelke	2004-04-13	$3,617,000

Carsten Hartig — 14 Patents

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