| 11792944 |
Valve for pressure compensation and/or for emergency venting of a container, in particular of a container of a battery of an electric vehicle, as well as container with such a valve |
Christian Voll, Thomas Hein, Andreas Genesius |
2023-10-17 |
| 11749485 |
Modular switch apparatus for controlling at least one electric drive |
Stephan Hansmeier, Matthias Ragaller, Dirk Plewka |
2023-09-05 |
| 10298218 |
Method and device for controlling an electrical or electronic switching element |
Lutz Heuer, Stephan Hansmeier, Dirk Plewka |
2019-05-21 |
| 9300126 |
Electrical apparatus for the short-circuit protection of a three-phase load in a three-phase system |
Elmar Schaper, Rainer Durth, Lutz Heuer |
2016-03-29 |
| 8652426 |
Use of aqueous guanidinium formate solutions for the selective catalytic reduction of nitrogen oxides in exhaust gases of vehicles |
Benedikt Hammer, Hans-Peter Krimmer, Eberhard Jacob |
2014-02-18 |
| 8531179 |
Method and device for the detection of current asymmetries in three-phase circuits |
Daniel Hawel, Andre Korrek, Elmar Schaper, Stephan Hansmeier, Lutz Heuer |
2013-09-10 |
| 8048390 |
Method for the selective catalytic reduction of nitrogen oxides in exhaust gases of vehicles |
Benedikt Hammer, Hans-Peter Krimmer, Eberhard Jacob |
2011-11-01 |
| 7842442 |
Method and system for reducing overlay errors within exposure fields by APC control strategies |
Rolf Seltmann, Fritjof Hempel, Uwe Schulze |
2010-11-30 |
| 7666559 |
Structure and method for determining an overlay accuracy |
— |
2010-02-23 |
| 7667842 |
Structure and method for simultaneously determining an overlay accuracy and pattern placement error |
— |
2010-02-23 |
| 7099010 |
Two-dimensional structure for determining an overlay accuracy by means of scatterometry |
— |
2006-08-29 |
| 6816252 |
Apparatus for determining an overlay error and critical dimensions in a semiconductor structure by means of scatterometry |
— |
2004-11-09 |
| 6795193 |
Scatterometer including an internal calibration system |
— |
2004-09-21 |
| 6767680 |
Semiconductor structure and method for determining critical dimensions and overlay error |
— |
2004-07-27 |
| 6765282 |
Semiconductor structure and method for determining critical dimensions and overlay error |
— |
2004-07-20 |
| 6724096 |
Die corner alignment structure |
Thomas Werner, Gunter Grasshoff, Carsten Hartig |
2004-04-20 |
| 6622579 |
Bearing arrangement for tension forces and bearing head therefor |
Michael Muth |
2003-09-23 |
| 6364002 |
Heat storage apparatus |
Christoph Hennig, Jochen Scharrer |
2002-04-02 |
| 5645354 |
Aerostatic bearing and method of manufacturing an aerostatic bearing |
Joachim Heinzl, Michael Muth |
1997-07-08 |
| 5564063 |
Method for manufacture of at least one micronozzle in an aerostatic bearing |
Joachim Heinzl, Michael Muth |
1996-10-08 |
