Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11792944 | Valve for pressure compensation and/or for emergency venting of a container, in particular of a container of a battery of an electric vehicle, as well as container with such a valve | Christian Voll, Thomas Hein, Andreas Genesius | 2023-10-17 |
| 11749485 | Modular switch apparatus for controlling at least one electric drive | Stephan Hansmeier, Matthias Ragaller, Dirk Plewka | 2023-09-05 |
| 10298218 | Method and device for controlling an electrical or electronic switching element | Lutz Heuer, Stephan Hansmeier, Dirk Plewka | 2019-05-21 |
| 9300126 | Electrical apparatus for the short-circuit protection of a three-phase load in a three-phase system | Elmar Schaper, Rainer Durth, Lutz Heuer | 2016-03-29 |
| 8652426 | Use of aqueous guanidinium formate solutions for the selective catalytic reduction of nitrogen oxides in exhaust gases of vehicles | Benedikt Hammer, Hans-Peter Krimmer, Eberhard Jacob | 2014-02-18 |
| 8531179 | Method and device for the detection of current asymmetries in three-phase circuits | Daniel Hawel, Andre Korrek, Elmar Schaper, Stephan Hansmeier, Lutz Heuer | 2013-09-10 |
| 8048390 | Method for the selective catalytic reduction of nitrogen oxides in exhaust gases of vehicles | Benedikt Hammer, Hans-Peter Krimmer, Eberhard Jacob | 2011-11-01 |
| 7842442 | Method and system for reducing overlay errors within exposure fields by APC control strategies | Rolf Seltmann, Fritjof Hempel, Uwe Schulze | 2010-11-30 |
| 7666559 | Structure and method for determining an overlay accuracy | — | 2010-02-23 |
| 7667842 | Structure and method for simultaneously determining an overlay accuracy and pattern placement error | — | 2010-02-23 |
| 7099010 | Two-dimensional structure for determining an overlay accuracy by means of scatterometry | — | 2006-08-29 |
| 6816252 | Apparatus for determining an overlay error and critical dimensions in a semiconductor structure by means of scatterometry | — | 2004-11-09 |
| 6795193 | Scatterometer including an internal calibration system | — | 2004-09-21 |
| 6767680 | Semiconductor structure and method for determining critical dimensions and overlay error | — | 2004-07-27 |
| 6765282 | Semiconductor structure and method for determining critical dimensions and overlay error | — | 2004-07-20 |
| 6724096 | Die corner alignment structure | Thomas Werner, Gunter Grasshoff, Carsten Hartig | 2004-04-20 |
| 6622579 | Bearing arrangement for tension forces and bearing head therefor | Michael Muth | 2003-09-23 |
| 6364002 | Heat storage apparatus | Christoph Hennig, Jochen Scharrer | 2002-04-02 |
| 5645354 | Aerostatic bearing and method of manufacturing an aerostatic bearing | Joachim Heinzl, Michael Muth | 1997-07-08 |
| 5564063 | Method for manufacture of at least one micronozzle in an aerostatic bearing | Joachim Heinzl, Michael Muth | 1996-10-08 |