Bernd Schulz — 20 Patents at AMD

Bernd Schulz has been granted 20 US patents while listed as an inventor at AMD. The first was granted in 1996 and the most recent in October 2023. Bernd Schulz ranks #214,803 of 4,157,543 US inventors in our database (top 5.2%). Patent records list Bernd Schulz in Steinheim, DE.

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11792944	Valve for pressure compensation and/or for emergency venting of a container, in particular of a container of a battery of an electric vehicle, as well as container with such a valve	Christian Voll, Thomas Hein, Andreas Genesius	2023-10-17
11749485	Modular switch apparatus for controlling at least one electric drive	Stephan Hansmeier, Matthias Ragaller, Dirk Plewka	2023-09-05
10298218	Method and device for controlling an electrical or electronic switching element	Lutz Heuer, Stephan Hansmeier, Dirk Plewka	2019-05-21
9300126	Electrical apparatus for the short-circuit protection of a three-phase load in a three-phase system	Elmar Schaper, Rainer Durth, Lutz Heuer	2016-03-29
8652426	Use of aqueous guanidinium formate solutions for the selective catalytic reduction of nitrogen oxides in exhaust gases of vehicles	Benedikt Hammer, Hans-Peter Krimmer, Eberhard Jacob	2014-02-18
8531179	Method and device for the detection of current asymmetries in three-phase circuits	Daniel Hawel, Andre Korrek, Elmar Schaper, Stephan Hansmeier, Lutz Heuer	2013-09-10
8048390	Method for the selective catalytic reduction of nitrogen oxides in exhaust gases of vehicles	Benedikt Hammer, Hans-Peter Krimmer, Eberhard Jacob	2011-11-01
7842442	Method and system for reducing overlay errors within exposure fields by APC control strategies	Rolf Seltmann, Fritjof Hempel, Uwe Schulze	2010-11-30	$11,033,000
7666559	Structure and method for determining an overlay accuracy	—	2010-02-23	$12,852,000
7667842	Structure and method for simultaneously determining an overlay accuracy and pattern placement error	—	2010-02-23	$12,852,000
7099010	Two-dimensional structure for determining an overlay accuracy by means of scatterometry	—	2006-08-29	$13,087,000
6816252	Apparatus for determining an overlay error and critical dimensions in a semiconductor structure by means of scatterometry	—	2004-11-09	$3,568,000
6795193	Scatterometer including an internal calibration system	—	2004-09-21	$3,701,000
6767680	Semiconductor structure and method for determining critical dimensions and overlay error	—	2004-07-27	$2,306,000
6765282	Semiconductor structure and method for determining critical dimensions and overlay error	—	2004-07-20	$1,607,000
6724096	Die corner alignment structure	Thomas Werner, Gunter Grasshoff, Carsten Hartig	2004-04-20	$2,632,000
6622579	Bearing arrangement for tension forces and bearing head therefor	Michael Muth	2003-09-23
6364002	Heat storage apparatus	Christoph Hennig, Jochen Scharrer	2002-04-02
5645354	Aerostatic bearing and method of manufacturing an aerostatic bearing	Joachim Heinzl, Michael Muth	1997-07-08
5564063	Method for manufacture of at least one micronozzle in an aerostatic bearing	Joachim Heinzl, Michael Muth	1996-10-08

Bernd Schulz — 20 Patents

Issued Patents All Time

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