Uwe Schulze — 19 Patents at AMD

Uwe Schulze has been granted 19 US patents while listed as an inventor at AMD. The first was granted in 2005 and the most recent in November 2021. Uwe Schulze ranks #229,345 of 4,157,543 US inventors in our database (top 5.5%). Patent records list Uwe Schulze in Düsseldorf, DE.

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11162364	Repair of monocrystalline flow channel segments by monocrystalline remelting	Knut Partes	2021-11-02
10099583	Method for producing an element having a cover, and such an element	—	2018-10-16
9957404	Low odor polymer latex and coating composition comprising the same	Claudia Eigen, Martina Pieper, Bertholt Schostak, Gareth Simpson, Michael Voss	2018-05-01
8888947	Method and system for advanced process control in an etch system by gas flow control on the basis of CD measurements	Matthias Schaller, Mathias Baranyai	2014-11-18	$1,887,000
8672404	Profile for fastening a cover on a vehicular seat headrest	Lars Hennig, Axel Posnien	2014-03-18	$62,297,000
8388062	Profile for fastening a cover on a vehicular seat headrest	Lars Hennig, Axel Posnien	2013-03-05	$28,449,000
8155770	Method and apparatus for dispatching workpieces to tools based on processing and performance history	Robert Barlovic, Jan Raebiger, Joerg Weigang, Jens Busch, Rolf Seltmann	2012-04-10	$5,913,000
8039181	Method and system for reducing overlay errors in semiconductor volume production using a mixed tool scenario	Rolf Seltmann, Jens Busch	2011-10-18	$1,986,000
7842442	Method and system for reducing overlay errors within exposure fields by APC control strategies	Rolf Seltmann, Bernd Schulz, Fritjof Hempel	2010-11-30	$11,033,000
7810237	Method for repairing and/or modifying component parts of a gas turbine	Anja Lange, Jens Lange	2010-10-12
7704889	Method and system for advanced process control in an etch system by gas flow control on the basis of CD measurements	Matthias Schaller, Mathias Baranyai	2010-04-27	$10,775,000
7618755	Method and system for automatically detecting exposed substrates having a high probability for defocused exposure fields	Jens Krause, Rolf Seltmann	2009-11-17	$39,002,000
7547561	Advanced process control model incorporating a target offset term	Martin Mazur, Andreas Becker	2009-06-16	$16,459,000
7542880	Time weighted moving average filter	Richard P. Good, Kevin Andrew Chamness	2009-06-02	$11,563,000
7403832	Method and system for advanced process control including tool dependent machine constants	Uwe Knappe	2008-07-22	$4,320,000
7233835	Method and system for estimating a state of an uninitialized advanced process controller by using segregated controller data	Richard P. Good	2007-06-19	$21,370,000
7200455	Method of process control	—	2007-04-03	$10,912,000
7006195	Method and system for improving exposure uniformity in a step and repeat process	Jan Raebiger, Heiko Wagner, Rolf Seltmann	2006-02-28	$11,043,000
6946411	Method and system for improving the efficiency of a mechanical alignment tool	Uwe Knappe, Jan Raebiger, Rolf Seltmann	2005-09-20	$11,506,000

Uwe Schulze — 19 Patents

Issued Patents All Time

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