Richard P. Good — 20 Patents at AMD

Richard P. Good has been granted 20 US patents while listed as an inventor at AMD. The first was granted in 2005 and the most recent in March 2025. Richard P. Good ranks #214,803 of 4,157,543 US inventors in our database (top 5.2%). Patent records list Richard P. Good in Saratoga Springs, NY, US.

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12253472	System and method for detecting a defect in a specimen	Roberto Schiwon, Matthias Ruhm, Dirk Wollstein	2025-03-18
11036912	Overlay optimization	Ian R. Krumanocker	2021-06-15
10788806	Initializing individual exposure field parameters of an overlay controller	Eyup Cinar	2020-09-29	$112,411,000
10754319	Across-wafer profile control in semiconductor processes	Dinesh Balasubra Manian, Houssam Lazkani	2020-08-25	$129,699,000
10481592	Selecting manufacturing settings based on historical data from manufacturing tools	Dirk Gleitsmann, Daniel Zschaebitz	2019-11-19	$41,143,000
10289109	Methods of error detection in fabrication processes	Eugene Barash, James Broc Stirton, Daniel Kost	2019-05-14	$20,760,000
10241502	Methods of error detection in fabrication processes	Eugene Barash, James Broc Stirton	2019-03-26	$28,977,000
8180471	Tuning a process controller based on a dynamic sampling rate	J. Broc Stirton, Detlef Pabst	2012-05-15	$7,029,000
8103478	Method and system for semiconductor process control and monitoring by using PCA models of reduced size	Daniel Kost	2012-01-24	$3,915,000
7974801	Method and system for a two-step prediction of a quality distribution of semiconductor devices	—	2011-07-05	$9,363,000
7908109	Identifying manufacturing disturbances using preliminary electrical test data	Lothar Waetzold, Thomas Depaly	2011-03-15	$6,095,000
7831324	Method and system for randomizing wafers in a complex process line	James Broc Stirton	2010-11-09	$4,649,000
7738986	Method and apparatus for compensating metrology data for site bias prior to filtering	James Broc Stirton, Kevin R. Lensing	2010-06-15	$14,576,000
7565254	Method and apparatus for metrology sampling using combination sampling rules	James Broc Stirton	2009-07-21	$9,005,000
7542880	Time weighted moving average filter	Kevin Andrew Chamness, Uwe Schulze	2009-06-02	$11,563,000
7460968	Method and apparatus for selecting wafers for sampling	Matthew A. Purdy	2008-12-02	$4,041,000
7330800	Method and apparatus for selecting sites for sampling	James Broc Stirton	2008-02-12	$7,674,000
7233835	Method and system for estimating a state of an uninitialized advanced process controller by using segregated controller data	Uwe Schulze	2007-06-19	$21,370,000
6985825	Method and apparatus for adaptive sampling based on process covariance	Timothy L. Jackson, Brian K. Cusson	2006-01-10	$17,911,000
6959224	Probability constrained optimization for electrical fabrication control	Gregory A. Cherry, Jin Wang	2005-10-25	$11,546,000

Richard P. Good — 20 Patents

Issued Patents All Time

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