Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7581140 | Initiating test runs based on fault detection results | Alexander J. Pasadyn, Elfido Coss, Jr., Naomi M. Jenkins | 2009-08-25 |
| 7246290 | Determining the health of a desired node in a multi-level system | Eric O. Green | 2007-07-17 |
| 7117062 | Determining transmission of error effects for improving parametric performance | Thomas J. Sonderman, Robert J. Chong, Alexander J. Pasadyn | 2006-10-03 |
| 7031793 | Conflict resolution among multiple controllers | Naomi M. Jenkins, Jin Wang, Richard J. Markle, Elfido Coss, Jr. | 2006-04-18 |
| 6991945 | Fault detection spanning multiple processes | Howard E. Castle, Matthew A. Purdy, Gregory A. Cherry, Richard J. Markle, Eric O. Green +1 more | 2006-01-31 |
| 6985825 | Method and apparatus for adaptive sampling based on process covariance | Richard P. Good, Timothy L. Jackson | 2006-01-10 |
| 6953697 | Advanced process control of the manufacture of an oxide-nitride-oxide stack of a memory device, and system for accomplishing same | Howard E. Castle, Robert J. Chong, Eric O. Green | 2005-10-11 |
| 6925347 | Process control based on an estimated process result | Michael L. Miller, Thomas J. Sonderman, Alexander J. Pasadyn, Richard J. Markle, Patrick M. Cowan +2 more | 2005-08-02 |
| 6834211 | Adjusting a trace data rate based upon a tool state | Elfido Coss, Jr. | 2004-12-21 |
| 6800562 | Method of controlling wafer charging effects due to manufacturing processes | Thomas J. Sonderman | 2004-10-05 |
| 6778873 | Identifying a cause of a fault based on a process controller output | Jin Wang, Elfido Coss, Jr., Alexander J. Pasadyn, Michael L. Miller, Naomi M. Jenkins +1 more | 2004-08-17 |
| 6766214 | Adjusting a sampling rate based on state estimation results | Jin Wang | 2004-07-20 |
| 6740534 | Determination of a process flow based upon fault detection analysis | Ernest D. Adams, III, Matthew A. Purdy, Gregory A. Cherry, Eric O. Green, Elfido Coss, Jr. +2 more | 2004-05-25 |
| 6446022 | Wafer fabrication system providing measurement data screening | Elfido Coss, Jr., Mike Simpson | 2002-09-03 |
| 6424876 | Statistical process control system with normalized control charting | James Sharier, Justin Giguere, Anatasia L. Oshelski | 2002-07-23 |