| 7581140 |
Initiating test runs based on fault detection results |
Alexander J. Pasadyn, Elfido Coss, Jr., Naomi M. Jenkins |
2009-08-25 |
| 7246290 |
Determining the health of a desired node in a multi-level system |
Eric O. Green |
2007-07-17 |
| 7117062 |
Determining transmission of error effects for improving parametric performance |
Thomas J. Sonderman, Robert J. Chong, Alexander J. Pasadyn |
2006-10-03 |
| 7031793 |
Conflict resolution among multiple controllers |
Naomi M. Jenkins, Jin Wang, Richard J. Markle, Elfido Coss, Jr. |
2006-04-18 |
| 6991945 |
Fault detection spanning multiple processes |
Howard E. Castle, Matthew A. Purdy, Gregory A. Cherry, Richard J. Markle, Eric O. Green +1 more |
2006-01-31 |
| 6985825 |
Method and apparatus for adaptive sampling based on process covariance |
Richard P. Good, Timothy L. Jackson |
2006-01-10 |
| 6953697 |
Advanced process control of the manufacture of an oxide-nitride-oxide stack of a memory device, and system for accomplishing same |
Howard E. Castle, Robert J. Chong, Eric O. Green |
2005-10-11 |
| 6925347 |
Process control based on an estimated process result |
Michael L. Miller, Thomas J. Sonderman, Alexander J. Pasadyn, Richard J. Markle, Patrick M. Cowan +2 more |
2005-08-02 |
| 6834211 |
Adjusting a trace data rate based upon a tool state |
Elfido Coss, Jr. |
2004-12-21 |
| 6800562 |
Method of controlling wafer charging effects due to manufacturing processes |
Thomas J. Sonderman |
2004-10-05 |
| 6778873 |
Identifying a cause of a fault based on a process controller output |
Jin Wang, Elfido Coss, Jr., Alexander J. Pasadyn, Michael L. Miller, Naomi M. Jenkins +1 more |
2004-08-17 |
| 6766214 |
Adjusting a sampling rate based on state estimation results |
Jin Wang |
2004-07-20 |
| 6740534 |
Determination of a process flow based upon fault detection analysis |
Ernest D. Adams, III, Matthew A. Purdy, Gregory A. Cherry, Eric O. Green, Elfido Coss, Jr. +2 more |
2004-05-25 |
| 6446022 |
Wafer fabrication system providing measurement data screening |
Elfido Coss, Jr., Mike Simpson |
2002-09-03 |
| 6424876 |
Statistical process control system with normalized control charting |
James Sharier, Justin Giguere, Anatasia L. Oshelski |
2002-07-23 |