Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9523976 | Method and system for processing a semiconductor wafer using data associated with previously processed wafers | — | 2016-12-20 |
| 8359494 | Parallel fault detection | Elfido Coss, Jr., Robert J. Chong, Howard E. Castle, Thomas J. Sonderman, Alexander J. Pasadyn | 2013-01-22 |
| 7672749 | Method and apparatus for hierarchical process control | — | 2010-03-02 |
| 7340318 | Method and apparatus for assessing controller performance | Gregory A. Cherry | 2008-03-04 |
| 7337034 | Method and apparatus for determining a root cause of a statistical process control failure | Kevin R. Lensing | 2008-02-26 |
| 7043325 | Method and apparatus for determining product-specific error and tool drift | — | 2006-05-09 |
| 6740534 | Determination of a process flow based upon fault detection analysis | Matthew A. Purdy, Gregory A. Cherry, Eric O. Green, Elfido Coss, Jr., Brian K. Cusson +2 more | 2004-05-25 |