Matthew A. Purdy — 36 Patents at AMD

Matthew A. Purdy has been granted 36 US patents while listed as an inventor at AMD. The first was granted in 2000 and the most recent in March 2014. Matthew A. Purdy ranks #92,222 of 4,157,543 US inventors in our database (top 2.2%). Patent records list Matthew A. Purdy in Austin, TX, US.

Issued Patents All Time

Showing 1–25 of 36 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8676538	Adjusting weighting of a parameter relating to fault detection based on a detected fault	—	2014-03-18	$1,595,000
7849366	Method and apparatus for predicting yield parameters based on fault classification	—	2010-12-07	$9,238,000
7715941	Method and apparatus for scheduling a plurality of processing tools	—	2010-05-11	$11,612,000
7695986	Method and apparatus for modifying process selectivities based on process state information	Matthew S. Ryskoski, Richard J. Markle	2010-04-13	$12,774,000
7473566	Method and apparatus for controlling a film formation process with multiple objectives	Robert J. Chong	2009-01-06	$9,608,000
7460968	Method and apparatus for selecting wafers for sampling	Richard P. Good	2008-12-02	$4,041,000
7299106	Method and apparatus for scheduling metrology based on a jeopardy count	Cabe W. Nicksic	2007-11-20	$5,989,000
7296103	Method and system for dynamically selecting wafer lots for metrology processing	Cabe W. Nicksic	2007-11-13	$5,321,000
7153709	Method and apparatus for calibrating degradable components using process state data	Richard J. Markle	2006-12-26	$21,181,000
7131937	Standing weightlifting apparatus	Stephen A. Skilken	2006-11-07
7100081	Method and apparatus for fault classification based on residual vectors	Robert J. Chong, Gregory A. Cherry, Richard J. Markle	2006-08-29	$13,087,000
7076321	Method and system for dynamically adjusting metrology sampling based upon available metrology capacity	—	2006-07-11	$11,570,000
7067333	Method and apparatus for implementing competing control models	Alexander J. Pasadyn	2006-06-27	$11,248,000
7069098	Method and system for prioritizing material to clear exception conditions	—	2006-06-27	$11,248,000
7069103	Controlling cumulative wafer effects	Christopher A. Bode	2006-06-27	$11,248,000
7026170	Methods of controlling optical properties of a capping insulating layer on memory devices, and system for performing same	—	2006-04-11	$9,016,000
6991945	Fault detection spanning multiple processes	Howard E. Castle, Gregory A. Cherry, Richard J. Markle, Eric O. Green, Michael L. Miller +1 more	2006-01-31	$15,487,000
6988045	Dynamic metrology sampling methods, and system for performing same	—	2006-01-17	$20,825,000
6988225	Verifying a fault detection result based on a process control state	Richard J. Markle, Timothy L. Jackson	2006-01-17	$20,825,000
6978189	Matching data related to multiple metrology tools	Christopher A. Bode, Alexander J. Pasadyn	2005-12-20	$11,866,000
6967068	Method of controlling stepper process parameters based upon optical properties of incoming anti-reflecting coating layers, and system for accomplishing same	Joyce S. Oey Hewett	2005-11-22	$6,256,000
6912436	Prioritizing an application of correction in a multi-input control system	Gary Jones, Christopher A. Bode, Richard D. Edwards	2005-06-28	$6,294,000
6871114	Updating process controller based upon fault detection analysis	Eric O. Green, Elfido Coss, Jr., Christopher A. Bode, Robert J. Chong, Gregory A. Cherry	2005-03-22
6790752	Methods of controlling VSS implants on memory devices, and system for performing same	—	2004-09-14	$2,721,000
6790686	Method and apparatus for integrating dispatch and process control actions	Cabe W. Nicksic	2004-09-14	$2,721,000

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Matthew A. Purdy — 36 Patents

Issued Patents All Time

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