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Richard D. Edwards — 29 Patents

AMD: 14 patents #867 of 9,280Top 10%
GTGreendot Technologies: 7 patents #1 of 2Top 50%
Austin, TX: #1,056 of 18,064 inventorsTop 6%
Texas: #4,128 of 125,132 inventorsTop 4%
Overall (All Time): #127,851 of 4,157,543Top 4%
29 Patents All Time
Richard D. Edwards has been granted 29 US patents while listed as an inventor at AMD. The first was granted in 1996 and the most recent in November 2014. Richard D. Edwards ranks #127,851 of 4,157,543 US inventors in our database (top 3.1%). Patent records list Richard D. Edwards in Austin, TX, US.

Issued Patents All Time

Showing 1–25 of 29 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
8888315 Vapor-tight lighting fixture Stanley A. Katz 2014-11-18
D698976 Lighting fixture with tubular lens Stanley A. Katz 2014-02-04
8616730 Vapor-tight lighting fixture Stanley A. Katz 2013-12-31
D650939 Housing assembly for a lighting fixture Stanley A. Katz 2011-12-20
D650938 Endcap for a lighting fixture with tubular lens Stanley A. Katz 2011-12-20
D650940 Housing end for lighting fixture Stanley A. Katz 2011-12-20
7731609 Golf green repair device method and apparatus Terry G. Wiens 2010-06-08
7588347 Lighting fixture — 2009-09-15
7485071 Fabric yoga straps — 2009-02-03
7377082 Insulative panel incorporating a support beam — 2008-05-27
7238126 Golf green repair device method and apparatus Terry G. Wiens 2007-07-03
7131753 Multi-arm adjustable fluorescent lighting fixture — 2006-11-07
7033288 Tool and method for golf green maintenance Terry G. Wiens 2006-04-25
6912436 Prioritizing an application of correction in a multi-input control system Gary Jones, Christopher A. Bode, Matthew A. Purdy 2005-06-28 $6,294,000
6815232 Method and apparatus for overlay control using multiple targets Gary Jones, Christopher A. Bode 2004-11-09 $3,568,000
6808946 Method of using critical dimension measurements to control stepper process parameters James Broc Stirton, Christopher A. Bode 2004-10-26 $3,793,000
6790570 Method of using scatterometry measurements to control stepper process parameters James Broc Stirton, Christopher A. Bode 2004-09-14 $2,721,000
6622061 Method and apparatus for run-to-run controlling of overlay registration Anthony J. Toprac, Christopher A. Bode 2003-09-16 $3,735,000
6551751 Method and apparatus for controlling a stepper Anthony J. Toprac, Curtis Warren Doss 2003-04-22 $3,266,000
6440622 Method for controlling and monitoring light source intensity Anthony J. Toprac, Curtis Warren Doss 2002-08-27 $1,474,000
6417912 Method and apparatus for controlling optical-parameters in a stepper Scott Bushman, Anthony J. Toprac, Edward C. Stewart 2002-07-09 $2,516,000
6405096 Method and apparatus for run-to-run controlling of overlay registration Anthony J. Toprac, Christopher A. Bode 2002-06-11 $2,353,000
6271602 Method for reducing the susceptibility to chemical-mechanical polishing damage of an alignment mark formed in a semiconductor substrate Paul Ackmann, Stuart E. Brown, Khanh B. Nguyen 2001-08-07 $4,984,000
6266132 Stepper with exposure time monitor Edward C. Stewart, Curtis Warren Doss 2001-07-24 $3,903,000
6207966 Mark protection with transparent film Khanh B. Nguyen, Harry J. Levinson, Stuart E. Brown, Paul Ackmann 2001-03-27 $5,495,000

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Yu-Hao Ho29