Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8888315 | Vapor-tight lighting fixture | Stanley A. Katz | 2014-11-18 |
| D698976 | Lighting fixture with tubular lens | Stanley A. Katz | 2014-02-04 |
| 8616730 | Vapor-tight lighting fixture | Stanley A. Katz | 2013-12-31 |
| D650939 | Housing assembly for a lighting fixture | Stanley A. Katz | 2011-12-20 |
| D650938 | Endcap for a lighting fixture with tubular lens | Stanley A. Katz | 2011-12-20 |
| D650940 | Housing end for lighting fixture | Stanley A. Katz | 2011-12-20 |
| 7731609 | Golf green repair device method and apparatus | Terry G. Wiens | 2010-06-08 |
| 7588347 | Lighting fixture | — | 2009-09-15 |
| 7485071 | Fabric yoga straps | — | 2009-02-03 |
| 7377082 | Insulative panel incorporating a support beam | — | 2008-05-27 |
| 7238126 | Golf green repair device method and apparatus | Terry G. Wiens | 2007-07-03 |
| 7131753 | Multi-arm adjustable fluorescent lighting fixture | — | 2006-11-07 |
| 7033288 | Tool and method for golf green maintenance | Terry G. Wiens | 2006-04-25 |
| 6912436 | Prioritizing an application of correction in a multi-input control system | Gary Jones, Christopher A. Bode, Matthew A. Purdy | 2005-06-28 |
| 6815232 | Method and apparatus for overlay control using multiple targets | Gary Jones, Christopher A. Bode | 2004-11-09 |
| 6808946 | Method of using critical dimension measurements to control stepper process parameters | James Broc Stirton, Christopher A. Bode | 2004-10-26 |
| 6790570 | Method of using scatterometry measurements to control stepper process parameters | James Broc Stirton, Christopher A. Bode | 2004-09-14 |
| 6622061 | Method and apparatus for run-to-run controlling of overlay registration | Anthony J. Toprac, Christopher A. Bode | 2003-09-16 |
| 6551751 | Method and apparatus for controlling a stepper | Anthony J. Toprac, Curtis Warren Doss | 2003-04-22 |
| 6440622 | Method for controlling and monitoring light source intensity | Anthony J. Toprac, Curtis Warren Doss | 2002-08-27 |
| 6417912 | Method and apparatus for controlling optical-parameters in a stepper | Scott Bushman, Anthony J. Toprac, Edward C. Stewart | 2002-07-09 |
| 6405096 | Method and apparatus for run-to-run controlling of overlay registration | Anthony J. Toprac, Christopher A. Bode | 2002-06-11 |
| 6271602 | Method for reducing the susceptibility to chemical-mechanical polishing damage of an alignment mark formed in a semiconductor substrate | Paul Ackmann, Stuart E. Brown, Khanh B. Nguyen | 2001-08-07 |
| 6266132 | Stepper with exposure time monitor | Edward C. Stewart, Curtis Warren Doss | 2001-07-24 |
| 6207966 | Mark protection with transparent film | Khanh B. Nguyen, Harry J. Levinson, Stuart E. Brown, Paul Ackmann | 2001-03-27 |