Matthew S. Ryskoski — 14 Patents at AMD

Matthew S. Ryskoski has been granted 14 US patents while listed as an inventor at AMD. The first was granted in 2002 and the most recent in October 2011. Matthew S. Ryskoski ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Matthew S. Ryskoski in Kyle, TX, US.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8040140	Method and apparatus for identifying broken pins in a test socket	Christopher Wooten, Song Han, Douglas C. Kimbrough	2011-10-18	$1,986,000
7695986	Method and apparatus for modifying process selectivities based on process state information	Matthew A. Purdy, Richard J. Markle	2010-04-13	$12,774,000
7282374	Method and apparatus for comparing device and non-device structures	Kevin R. Lensing	2007-10-16	$23,867,000
7277824	Method and apparatus for classifying faults based on wafer state data and sensor tool trace data	Kevin R. Lensing	2007-10-02	$16,573,000
7217578	Advanced process control of thermal oxidation processes, and systems for accomplishing same	Michael J. McBride, Jesse C. Ramos, Mark E. Culp, Pirainder Lall	2007-05-15	$18,237,000
7197370	Method and apparatus for dynamic adjustment of an active sensor list	—	2007-03-27	$8,823,000
6978187	Method and apparatus for scheduling production lots based on lot and tool health metrics	—	2005-12-20	$11,866,000
6868353	Method and apparatus for determining wafer quality profiles	—	2005-03-15	$4,259,000
6799311	Batch/lot organization based on quality characteristics	—	2004-09-28	$1,915,000
6721616	Method and apparatus for determining control actions based on tool health and metrology data	—	2004-04-13	$3,617,000
6617258	Method of forming a gate insulation layer for a semiconductor device by controlling the duration of an etch process, and system for accomplishing same	Thomas J. Sonderman	2003-09-09	$4,832,000
6593227	Method and apparatus for planarizing surfaces of semiconductor device conductive layers	—	2003-07-15	$1,952,000
6582975	Method of controlling the deposition of inter-level dielectric layers based upon electrical performance tests, and system for accomplishing same	—	2003-06-24	$2,352,000
6371135	Method and apparatus for removing a particle from a surface of a semiconductor wafer	—	2002-04-16	$2,231,000

Matthew S. Ryskoski — 14 Patents

Issued Patents All Time

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