Patents per Year
Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 9837398 | Metal track cutting in standard cell layouts | Omid Rowhani, Ioan Cordos, Michael Davinson Sherriff, Hoang Q. Dao | 2017-12-05 | $14,904,000 |
| 7875851 | Advanced process control framework using two-dimensional image analysis | Chris Haidinyak, Bhanwar Singh | 2011-01-25 | $8,589,000 |
| 7663766 | Incorporating film optical property measurements into scatterometry metrology | Carsten Hartig | 2010-02-16 | $19,031,000 |
| 7460922 | Scanner optimization for reduced across-chip performance variation through non-contact electrical metrology | Bhanwar Singh, Harish K. Bolla, Iraj Emami | 2008-12-02 | $4,041,000 |
| 7373215 | Transistor gate shape metrology using multiple data sources | Bhanwar Singh, Iraj Emami | 2008-05-13 | $15,194,000 |