Chris Haidinyak — 9 Patents at AMD

Chris Haidinyak has been granted 9 US patents while listed as an inventor at AMD. The first was granted in 2004 and the most recent in January 2011. Chris Haidinyak ranks #535,341 of 4,157,543 US inventors in our database (top 12.9%). Patent records list Chris Haidinyak in Santa Cruz, CA, US.

Patents per Year

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7875851	Advanced process control framework using two-dimensional image analysis	Jason P. Cain, Bhanwar Singh	2011-01-25	$8,589,000
7657864	System and method for integrated circuit device design and manufacture using optical rule checking to screen resolution enhancement techniques	Cyrus E. Tabery, Todd P. Lukanc, Luigi Capodieci, Carl P. Babcock, Hung-Eil Kim +1 more	2010-02-02	$18,664,000
7543256	System and method for designing an integrated circuit device	Todd P. Lukanc, Cyrus E. Tabery, Luigi Capodieci, Carl P. Babcock, Hung-Eil Kim +1 more	2009-06-02	$11,563,000
7313769	Optimizing an integrated circuit layout by taking into consideration layout interactions as well as extra manufacturability margin	Todd P. Lukanc, Cyrus E. Tabery, Luigi Capodieci, Carl P. Babcock, Hung-Eil Kim +1 more	2007-12-25
7269804	System and method for integrated circuit device design and manufacture using optical rule checking to screen resolution enhancement techniques	Cyrus E. Tabery, Todd P. Lukanc, Luigi Capodieci, Carl P. Babcock, Hung-Eil Kim +1 more	2007-09-11	$10,117,000
7207017	Method and system for metrology recipe generation and review and analysis of design, simulation and metrology results	Cyrus E. Tabery, Todd P. Lukanc, Luigi Capodieci, Carl P. Babcock, Hung-Eil Kim +1 more	2007-04-17	$14,172,000
7194725	System and method for design rule creation and selection	Todd P. Lukanc, Cyrus E. Tabery, Luigi Capodieci, Carl P. Babcock, Hung-Eil Kim +1 more	2007-03-20	$9,786,000
6982136	Method and system for determining optimum optical proximity corrections within a photolithography system	—	2006-01-03	$22,329,000
6824937	Method and system for determining optimum optical proximity corrections within a photolithography system	—	2004-11-30	$7,368,000

Chris Haidinyak — 9 Patents

Patents per Year

Issued Patents All Time

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