Iraj Emami — 11 Patents at AMD

Iraj Emami has been granted 11 US patents while listed as an inventor at AMD. The first was granted in 2001 and the most recent in December 2008. Iraj Emami ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Iraj Emami in Austin, TX, US.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7460922	Scanner optimization for reduced across-chip performance variation through non-contact electrical metrology	Bhanwar Singh, Jason P. Cain, Harish K. Bolla	2008-12-02	$4,041,000
7373215	Transistor gate shape metrology using multiple data sources	Jason P. Cain, Bhanwar Singh	2008-05-13	$15,194,000
7334202	Optimizing critical dimension uniformity utilizing a resist bake plate simulator	Bhanwar Singh, Qiaolin Zhang, Joyce S. Oey Hewett, Luigi Capodiece	2008-02-19	$10,551,000
7221060	Composite alignment mark scheme for multi-layers in lithography	Bhanwar Singh, Khoi A. Phan, Bharath Rangarajan, Ramkumar Subramanian	2007-05-22	$14,345,000
7158896	Real time immersion medium control using scatterometry	Bhanwar Singh, Srikanteswara Dakshina-Murthy, Khoi A. Phan, Ramkumar Subramanian, Bharath Rangarajan	2007-01-02
6560504	Use of contamination-free manufacturing data in fault detection and classification as well as in run-to-run control	Thomas J. Goodwin, Charles E. May	2003-05-06	$2,132,000
6452412	Drop-in test structure and methodology for characterizing an integrated circuit process flow and topography	Richard W. Jarvis, Charles E. May	2002-09-17	$1,456,000
6297644	Multipurpose defect test structure with switchable voltage contrast capability and method of use	Richard W. Jarvis, John L. Nistler, Michael G. McIntyre	2001-10-02	$2,425,000
6294397	Drop-in test structure and abbreviated integrated circuit process flow for characterizing production integrated circuit process flow, topography, and equipment	Richard W. Jarvis, Charles E. May	2001-09-25	$2,966,000
6268717	Semiconductor test structure with intentional partial defects and method of use	Richard W. Jarvis, Alan Bruce Berezin	2001-07-31	$5,560,000
6242273	Fractal filter applied to a contamination-free manufacturing signal to improve signal-to-noise ratios	Thomas J. Goodwin, Charles E. May	2001-06-05	$7,807,000

Iraj Emami — 11 Patents

Issued Patents All Time

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