Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12311992 | Method and apparatus for protecting walls from damage by wheeled carts | Anthony Gentile | 2025-05-27 |
| 8239151 | Method and apparatus for analysis of continuous data using binary parsing | Michael A. Retersdorf | 2012-08-07 |
| 8041518 | Determining die test protocols based on process health | Kevin R. Lensing | 2011-10-18 |
| 7899634 | Method and apparatus for analysis of continuous data using binary parsing | Michael A. Retersdorf | 2011-03-01 |
| 7862406 | Saw chain sharpening assembly | — | 2011-01-04 |
| 7822567 | Method and apparatus for implementing scaled device tests | Kevin R. Lensing | 2010-10-26 |
| 7710137 | Method and apparatus for relative testing of integrated circuit devices | — | 2010-05-04 |
| 7583833 | Method and apparatus for manufacturing data indexing | Alex Bierwag, Charlie Reading, Alfredo Herrera | 2009-09-01 |
| 7539552 | Method and apparatus for implementing a universal coordinate system for metrology data | Zhuqing Zong, Andrew Drozda-Freeman, Vijay G. Sankaran | 2009-05-26 |
| 7533313 | Method and apparatus for identifying outlier data | Michael A. Retersdorf | 2009-05-12 |
| 7236848 | Data representation relating to a non-sampled workpiece | Steven P. Reeves | 2007-06-26 |
| 7195931 | Split manufacturing method for advanced semiconductor circuits | Richard W. Jarvis | 2007-03-27 |
| 7106897 | Universal spatial pattern recognition system | James E. Morris | 2006-09-12 |
| 6362634 | Integrated defect monitor structures for conductive features on a semiconductor topography and method of use | Richard W. Jarvis | 2002-03-26 |
| 6297644 | Multipurpose defect test structure with switchable voltage contrast capability and method of use | Richard W. Jarvis, Iraj Emami, John L. Nistler | 2001-10-02 |
| 6063685 | Device level identification methodology | Paul J. Steffan, Charlie Reading | 2000-05-16 |
| 5913105 | Method and system for recognizing scratch patterns on semiconductor wafers | Thinh Ngo | 1999-06-15 |