Michael G. McIntyre — 17 Patents at AMD

Michael G. McIntyre has been granted 17 US patents while listed as an inventor at AMD. The first was granted in 1999 and the most recent in May 2025. Michael G. McIntyre ranks #263,971 of 4,157,543 US inventors in our database (top 6.3%). Patent records list Michael G. McIntyre in Wilmington, NC, US.

Patents per Year

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12311992	Method and apparatus for protecting walls from damage by wheeled carts	Anthony Gentile	2025-05-27
8239151	Method and apparatus for analysis of continuous data using binary parsing	Michael A. Retersdorf	2012-08-07	$3,769,000
8041518	Determining die test protocols based on process health	Kevin R. Lensing	2011-10-18	$1,986,000
7899634	Method and apparatus for analysis of continuous data using binary parsing	Michael A. Retersdorf	2011-03-01	$8,863,000
7862406	Saw chain sharpening assembly	—	2011-01-04
7822567	Method and apparatus for implementing scaled device tests	Kevin R. Lensing	2010-10-26	$18,913,000
7710137	Method and apparatus for relative testing of integrated circuit devices	—	2010-05-04	$39,204,000
7583833	Method and apparatus for manufacturing data indexing	Alex Bierwag, Charlie Reading, Alfredo Herrera	2009-09-01	$18,287,000
7539552	Method and apparatus for implementing a universal coordinate system for metrology data	Zhuqing Zong, Andrew Drozda-Freeman, Vijay G. Sankaran	2009-05-26	$27,641,000
7533313	Method and apparatus for identifying outlier data	Michael A. Retersdorf	2009-05-12	$10,479,000
7236848	Data representation relating to a non-sampled workpiece	Steven P. Reeves	2007-06-26	$10,288,000
7195931	Split manufacturing method for advanced semiconductor circuits	Richard W. Jarvis	2007-03-27	$8,823,000
7106897	Universal spatial pattern recognition system	James E. Morris	2006-09-12	$23,698,000
6362634	Integrated defect monitor structures for conductive features on a semiconductor topography and method of use	Richard W. Jarvis	2002-03-26	$3,803,000
6297644	Multipurpose defect test structure with switchable voltage contrast capability and method of use	Richard W. Jarvis, Iraj Emami, John L. Nistler	2001-10-02	$2,425,000
6063685	Device level identification methodology	Paul J. Steffan, Charlie Reading	2000-05-16	$14,024,000
5913105	Method and system for recognizing scratch patterns on semiconductor wafers	Thinh Ngo	1999-06-15

Michael G. McIntyre — 17 Patents

Patents per Year

Issued Patents All Time

Patent Widget