| 6780568 |
Phase-shift photomask for patterning high density features |
Stuart E. Brown |
2004-08-24 |
| 6750544 |
Metallization system for use in a semiconductor component |
John D. Spano |
2004-06-15 |
| 6562521 |
Semiconductor feature having support islands |
Stuart E. Brown |
2003-05-13 |
| 6452180 |
Infrared inspection for determining residual films on semiconductor devices |
Christopher H. Raeder |
2002-09-17 |
| 6410191 |
Phase-shift photomask for patterning high density features |
Stuart E. Brown |
2002-06-25 |
| 6297644 |
Multipurpose defect test structure with switchable voltage contrast capability and method of use |
Richard W. Jarvis, Iraj Emami, Michael G. McIntyre |
2001-10-02 |
| 6226781 |
Modifying a design layer of an integrated circuit using overlying and underlying design layers |
Frederick N. Hause, Phillip J. Etter |
2001-05-01 |
| 6210999 |
Method and test structure for low-temperature integration of high dielectric constant gate dielectrics into self-aligned semiconductor devices |
Mark I. Gardner, Charles E. May |
2001-04-03 |
| 6188233 |
Method for determining proximity effects on electrical characteristics of semiconductor devices |
Mark W. Michael |
2001-02-13 |
| 6096616 |
Fabrication of a non-ldd graded p-channel mosfet |
Mark W. Michael |
2000-08-01 |
| 6083272 |
Method of adjusting currents on a semiconductor device having transistors of varying density |
Derick J. Wristers |
2000-07-04 |
| 6072222 |
Silicon implantation into selective areas of a refractory metal to reduce consumption of silicon-based junctions during salicide formation |
— |
2000-06-06 |
| 5990488 |
Useable drop-in strategy for correct electrical analysis of semiconductor devices |
Charles E. May, Kenneth J. Morrissey |
1999-11-23 |
| 5308722 |
Voting technique for the manufacture of defect-free printing phase shift lithography |
— |
1994-05-03 |