Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6780568 | Phase-shift photomask for patterning high density features | Stuart E. Brown | 2004-08-24 |
| 6750544 | Metallization system for use in a semiconductor component | John D. Spano | 2004-06-15 |
| 6562521 | Semiconductor feature having support islands | Stuart E. Brown | 2003-05-13 |
| 6452180 | Infrared inspection for determining residual films on semiconductor devices | Christopher H. Raeder | 2002-09-17 |
| 6410191 | Phase-shift photomask for patterning high density features | Stuart E. Brown | 2002-06-25 |
| 6297644 | Multipurpose defect test structure with switchable voltage contrast capability and method of use | Richard W. Jarvis, Iraj Emami, Michael G. McIntyre | 2001-10-02 |
| 6226781 | Modifying a design layer of an integrated circuit using overlying and underlying design layers | Frederick N. Hause, Phillip J. Etter | 2001-05-01 |
| 6210999 | Method and test structure for low-temperature integration of high dielectric constant gate dielectrics into self-aligned semiconductor devices | Mark I. Gardner, Charles E. May | 2001-04-03 |
| 6188233 | Method for determining proximity effects on electrical characteristics of semiconductor devices | Mark W. Michael | 2001-02-13 |
| 6096616 | Fabrication of a non-ldd graded p-channel mosfet | Mark W. Michael | 2000-08-01 |
| 6083272 | Method of adjusting currents on a semiconductor device having transistors of varying density | Derick J. Wristers | 2000-07-04 |
| 6072222 | Silicon implantation into selective areas of a refractory metal to reduce consumption of silicon-based junctions during salicide formation | — | 2000-06-06 |
| 5990488 | Useable drop-in strategy for correct electrical analysis of semiconductor devices | Charles E. May, Kenneth J. Morrissey | 1999-11-23 |
| 5308722 | Voting technique for the manufacture of defect-free printing phase shift lithography | — | 1994-05-03 |