Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11268353 | Energy deposit discovery system and method | Justin Reed Birmingham, Mark Robinson, Samuel V. Scarpino, Jason Simmons, Christopher Smith | 2022-03-08 |
| 10577895 | Energy deposit discovery system and method | Justin Reed Birmingham, Mark Robinson, Samuel V. Scarpino, Jason Simmons, Christopher Smith | 2020-03-03 |
| 6268717 | Semiconductor test structure with intentional partial defects and method of use | Richard W. Jarvis, Iraj Emami | 2001-07-31 |
| 5831865 | Method and system for declusturing semiconductor defect data | Reuben Quintanilla | 1998-11-03 |
| 5777901 | Method and system for automated die yield prediction in semiconductor manufacturing | Reuben Quintanilla | 1998-07-07 |
| 5649169 | Method and system for declustering semiconductor defect data | Reuben Quintanilla | 1997-07-15 |
| 5539752 | Method and system for automated analysis of semiconductor defect data | Reuben Quintanilla | 1996-07-23 |