Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5831865 | Method and system for declusturing semiconductor defect data | Alan Bruce Berezin | 1998-11-03 |
| 5777901 | Method and system for automated die yield prediction in semiconductor manufacturing | Alan Bruce Berezin | 1998-07-07 |
| 5649169 | Method and system for declustering semiconductor defect data | Alan Bruce Berezin | 1997-07-15 |
| 5539752 | Method and system for automated analysis of semiconductor defect data | Alan Bruce Berezin | 1996-07-23 |