Christin Bartsch — 7 Patents at AMD

Christin Bartsch has been granted 7 US patents while listed as an inventor at AMD. The first was granted in 2007 and the most recent in March 2014. Christin Bartsch ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list Christin Bartsch in Lauterbach, DE.

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Showing 1–7 of 7 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
8673087	Reducing copper defects during a wet chemical cleaning of exposed copper surfaces in a metallization layer of a semiconductor device	Frank Feustel, Tobias Letz, Andreas Ott	2014-03-18	$1,595,000
8664115	Copper interconnect with metal hardmask removal	Susanne Leppack	2014-03-04	$1,501,000
8423320	Method and system for quantitative inline material characterization in semiconductor production processes based on structural measurements and related models	Matthias Schaller, Thomas Oszinda, Daniel Fischer	2013-04-16	$3,756,000
8338293	Method of reducing erosion of a metal cap layer during via patterning in semiconductor devices	Daniel Fischer, Matthias Schaller	2012-12-25
7986040	Method of reducing erosion of a metal cap layer during via patterning in semiconductor devices	Daniel Fischer, Matthias Schaller	2011-07-26	$4,784,000
7410885	Method of reducing contamination by removing an interlayer dielectric from the substrate edge	Holger Schuehrer, Carsten Hartig	2008-08-12	$9,390,000
7259091	Technique for forming a passivation layer prior to depositing a barrier layer in a copper metallization layer	Holger Schuehrer, Carsten Hartig, Kai Frohberg	2007-08-21	$20,186,000

Christin Bartsch — 7 Patents

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