Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11581369 | Semiconductor switch element and method of manufacturing the same | Sylvain Leomant, Gerhard Noebauer, Christian Gruber, Sergey Ananiev | 2023-02-14 |
| 11322655 | Method for producing an optoelectronic component, and optoelectronic component | Attila Molnar, Fabian Kopp | 2022-05-03 |
| 11011504 | Optoelectronic semiconductor chip and method of producing an optoelectronic semiconductor chip | Ban Loong Chris NG | 2021-05-18 |
| 10867923 | Semiconductor device | Sang-Hoon Ahn, Tae-Soo Kim, Jong-Min Baek, Woo Kyung You, Byung-Hee Kim +1 more | 2020-12-15 |
| 10128148 | Methods for fabricating semiconductor devices including surface treatment processes | Viet Ha Nguyen, Nae-In Lee, Byung-Hee Kim, Jong-Min Baek, Tae Jin Yim | 2018-11-13 |
| 10096549 | Semiconductor devices having interconnection structure | Byung-Hee Kim, Deok-Young Jung, Jong-Min Baek, Tae Jin Yim | 2018-10-09 |
| 9972528 | Semiconductor devices | VietHa Nguyen, Jongmin Baek, Sanghoon Ahn, Byunghee Kim, Wookyung You +1 more | 2018-05-15 |
| 9929098 | Copper via with barrier layer and cap layer | Tae Jin Yim, Sang-Hoon Ahn, Jong-Min Baek, Byung-Hee Kim, Nae-In Lee +1 more | 2018-03-27 |
| 9666478 | Methods of forming wiring structures and methods of manufacturing semiconductor devices | Tae Jin Yim, Sang-Hoon Ahn, Nae-In Lee | 2017-05-30 |
| 9653400 | Semiconductor device and method of manufacturing the same | Tae Jin Yim, Woo Kyung You, Jong-Min Baek, Sang-Hoon Ahn, Kee-Young Jun | 2017-05-16 |
| 9576848 | Method of treating a porous dielectric layer and a method of fabricating a semiconductor device using the same | Taejin Yim, Byunghee Kim, Sanghoon Ahn, Naein Lee, Keeyoung Jun | 2017-02-21 |
| 8575041 | Repair of damaged surface areas of sensitive low-K dielectrics of microstructure devices after plasma processing by in situ treatment | Matthias Schaller, Daniel Fischer | 2013-11-05 |
| 8440579 | Re-establishing surface characteristics of sensitive low-k dielectrics in microstructure device by using an in situ surface modification | Matthias Schaller, Daniel Fischer | 2013-05-14 |
| 8423320 | Method and system for quantitative inline material characterization in semiconductor production processes based on structural measurements and related models | Matthias Schaller, Christin Bartsch, Daniel Fischer | 2013-04-16 |