KC

Kangguo Cheng

IBM: 337 patents #1 of 11,143Top 1%
Globalfoundries: 25 patents #6 of 837Top 1%
SS Stmicroelectronics Sa: 1 patents #41 of 130Top 35%
📍 Schenectady, NY: #1 of 145 inventorsTop 1%
🗺 New York: #1 of 13,137 inventorsTop 1%
Overall (2019): #1 of 560,194Top 1%
354
Patents 2019

Issued Patents 2019

Showing 201–225 of 354 patents

Patent #TitleCo-InventorsDate
10297667 Fin field-effect transistor for input/output device integrated with nanosheet field-effect transistor Chun Wing Yeung, Chen Zhang, Peng Xu, Huiming Bu 2019-05-21
10297507 Self-aligned vertical field-effect transistor with epitaxially grown bottom and top source drain regions Shogo Mochizuki, Tenko Yamashita, Chen Zhang 2019-05-21
10297448 SiGe fins formed on a substrate Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2019-05-21
10290633 CMOS compatible fuse or resistor using self-aligned contacts Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2019-05-14
10290574 Embedded metal-insulator-metal (MIM) decoupling capacitor in monolitic three-dimensional (3D) integrated circuit (IC) structure Geng Wang, Chengwen Pei, Juntao Li 2019-05-14
10283504 Vertical FET with reduced parasitic capacitance Xin Miao, Philip J. Oldiges, Wenyu Xu, Chen Zhang 2019-05-07
10283625 Integrated strained stacked nanosheet FET Ramachandra Divakaruni, Juntao Li, Xin Miao 2019-05-07
10283606 Vertical fin with a gate structure having a modified gate geometry Peng Xu 2019-05-07
10283602 Fully depleted SOI device for reducing parasitic back gate capacitance Ramachandra Divakaruni 2019-05-07
10283601 Strained silicon germanium fin with block source/drain epitaxy and improved overlay capacitance Karthik Balakrishnan, Pouya Hashemi, Alexander Reznicek 2019-05-07
10283592 Approach to minimization of strain loss in strained fin field effect transistors Zhenxing Bi, Juntao Li, Peng Xu 2019-05-07
10283586 Capacitors Veeraraghavan S. Basker, Christopher J. Penny, Theodorus E. Standaert, Junli Wang 2019-05-07
10283565 Resistive memory with a plurality of resistive random access memory cells each comprising a transistor and a resistive element Peng Xu, Juntao Li, Choonghyun Lee 2019-05-07
10283406 Fabrication of self-aligned gate contacts and source/drain contacts directly above gate electrodes and source/drains Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2019-05-07
10276569 Minimizing shorting between FinFET epitaxial regions Balasubramanian Pranatharthiharan, Alexander Reznicek, Charan V. Surisetty 2019-04-30
10276659 Air gap adjacent a bottom source/drain region of vertical transistor device Ruilong Xie, Chun-Chen Yeh, Tenko Yamashita 2019-04-30
10276658 FinFET devices Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2019-04-30
10276442 Wrap-around contacts formed with multiple silicide layers Ruilong Xie, Julien Frougier, Adra Carr, Nicolas Loubet 2019-04-30
10269644 Fin pitch scaling for high voltage devices and low voltage devices on the same wafer Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2019-04-23
10269983 Stacked nanosheet field-effect transistor with air gap spacers Julien Frougier, Ruilong Xie, Hui Zang, Tenko Yamashita, Chun-Chen Yeh 2019-04-23
10269931 Vertical transport field effect transistor with precise gate length definition Marc A. Bergendahl, Fee Li Lie, Eric R. Miller, John R. Sporre, Sean Teehan 2019-04-23
10269920 Nanosheet transistors having thin and thick gate dielectric material Ruilong Xie, Tenko Yamashita, Chun-Chen Yeh 2019-04-23
10269790 Forming horizontal bipolar junction transistor compatible with nanosheets Juntao Li, Geng Wang, Qintao Zhang 2019-04-23
10262861 Forming a fin cut in a hardmask Zhenxing Bi, Juntao Li, Peng Xu 2019-04-16
10263100 Buffer regions for blocking unwanted diffusion in nanosheet transistors Zhenxing Bi, Juntao Li, Peng Xu 2019-04-16