TY

Tenko Yamashita

IBM: 68 patents #22 of 11,143Top 1%
Globalfoundries: 20 patents #12 of 837Top 2%
RE Renesas Electronics: 1 patents #231 of 741Top 35%
📍 Schenectady, NY: #2 of 145 inventorsTop 2%
🗺 New York: #10 of 13,137 inventorsTop 1%
Overall (2019): #105 of 560,194Top 1%
78
Patents 2019

Issued Patents 2019

Showing 1–25 of 78 patents

Patent #TitleCo-InventorsDate
10510617 CMOS VFET contacts with trench solid and liquid phase epitaxy Oleg Gluschenkov, Zuoguang Liu, Shogo Mochizuki, Hiroaki Niimi 2019-12-17
10490653 Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors Su Chen Fan, Zuoguang Liu, Heng Wu 2019-11-26
10468525 VFET CMOS dual epitaxy integration Kangguo Cheng, Ruilong Xie, Chun-Chen Yeh 2019-11-05
10453922 Conformal doping for punch through stopper in fin field effect transistor devices Huiming Bu, Sivananda K. Kanakasabapathy, Fee Li Lie 2019-10-22
10453939 Reduced capacitance in vertical transistors by preventing excessive overlap between the gate and the source/drain Kangguo Cheng, Ruilong Xie, Chun-Chen Yeh 2019-10-22
10439031 Integration of vertical-transport transistors and electrical fuses Ruilong Xie, Kangguo Cheng, Chun-Chen Yeh 2019-10-08
10439045 Flipped VFET with self-aligned junctions and controlled gate length Chen Zhang 2019-10-08
10418277 Air gap spacer formation for nano-scale semiconductor devices Kangguo Cheng, Thomas J. Haigh, Jr., Juntao Li, Eric G. Liniger, Sanjay C. Mehta +2 more 2019-09-17
10418485 Forming a combination of long channel devices and vertical transport Fin field effect transistors on the same substrate Cheng Chi, Chen Zhang 2019-09-17
10411127 Forming a combination of long channel devices and vertical transport fin field effect transistors on the same substrate Cheng Chi, Chen Zhang 2019-09-10
10396177 Prevention of extension narrowing in nanosheet field effect transistors Chun Wing Yeung, Chen Zhang 2019-08-27
10396178 Method of forming improved vertical FET process with controlled gate length and self-aligned junctions Chen Zhang 2019-08-27
10396000 Test structure macro for monitoring dimensions of deep trench isolation regions and local trench isolation regions Chun-Chen Yeh, Hui Zang 2019-08-27
10396183 Parasitic capacitance reducing contact structure in a finFET Miaomiao Wang, Chun-Chen Yeh, Hui Zang 2019-08-27
10396208 Vertical transistors with improved top source/drain junctions Kangguo Cheng, Muthumanickam Sankarapandian, Ruilong Xie, Chun-Chen Yeh 2019-08-27
10388731 Stacked nanowire device width adjustment by gas cluster ion beam (GCIB) Kangguo Cheng, Xin Miao, Ruilong Xie 2019-08-20
10388754 Unmerged epitaxial process for FinFET devices with aggressive fin pitch scaling Xiuyu Cai, Kangguo Cheng, Ali Khakifirooz, Ruilong Xie 2019-08-20
10388768 Parasitic capacitance reducing contact structure in a finFET Miaomiao Wang, Chun-Chen Yeh, Hui Zang 2019-08-20
10388769 Parasitic capacitance reducing contact structure in a finFET Miaomiao Wang, Chun-Chen Yeh, Hui Zang 2019-08-20
10381273 Vertically stacked multi-channel transistor structure Kangguo Cheng, Chun-Chen Yeh, Ruilong Xie 2019-08-13
10381346 Logic gate designs for 3D monolithic direct stacked VTFET Chen Zhang, Terence B. Hook 2019-08-13
10374064 Fin field effect transistor complementary metal oxide semiconductor with dual strained channels with solid phase doping Kangguo Cheng, Ruilong Xie 2019-08-06
10374060 VFET bottom epitaxy formed with anchors Chen Zhang 2019-08-06
10367069 Fabrication of vertical field effect transistor structure with controlled gate length Kangguo Cheng, Ruilong Xie, Chun-Chen Yeh 2019-07-30
10366931 Nanosheet devices with CMOS epitaxy and method of forming Ruilong Xie, Cheng Chi, Pietro Montanini, Nicolas Loubet 2019-07-30