Issued Patents All Time
Showing 76–100 of 205 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9059173 | Electronic fuse line with modified cap | Ronald G. Filippi, John A. Fitzsimmons, Erdem Kaltalioglu, Lijuan Zhang | 2015-06-16 |
| 9059170 | Electronic fuse having a damaged region | Junjing Bao, Griselda Bonilla, Samuel S. Choi, Ronald G. Filippi, Wai-Kin Li +4 more | 2015-06-16 |
| 9059166 | Interconnect with hybrid metallization | Ronald G. Filippi, Erdem Kaltalioglu, Lijuan Zhang | 2015-06-16 |
| 9059111 | Reliable back-side-metal structure | Robert D. Edwards, Jeffrey P. Gambino, Charles F. Musante | 2015-06-16 |
| 9054898 | Processing electronic messages according to sender classification | Marc Dreyfus, Derek Lam, Michael Muller, Asima Silva, Robert C. Weir | 2015-06-09 |
| 9054108 | Random local metal cap layer formation for improved integrated circuit reliability | Ronald G. Filippi, Erdem Kaltalioglu, Wai-Kin Li, Lijuan Zhang | 2015-06-09 |
| 9043179 | Voltage-driven intelligent characterization bench for semiconductor | Charles J. Montrose | 2015-05-26 |
| 8963567 | Pressure sensing and control for semiconductor wafer probing | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Yongchun Xin | 2015-02-24 |
| 8912658 | Interconnect structure with enhanced reliability | Ronald G. Filippi, Griselda Bonilla, Kaushik Chanda, Robert D. Edwards, Andrew H. Simon | 2014-12-16 |
| 8906799 | Random local metal cap layer formation for improved integrated circuit reliability | Ronald G. Filippi, Erdem Kaltalioglu, Wai-Kin Li, Lijuan Zhang | 2014-12-09 |
| 8898111 | Enforcing temporal uniqueness of index keys utilizing key-valued locking in the presence of pseudo-deleted keys | Robert W. Lyle | 2014-11-25 |
| 8892515 | Enforcing temporal uniqueness of index keys utilizing key-valued locking in the presence of pseudo-deleted keys | Robert W. Lyle | 2014-11-18 |
| 8889491 | Method of forming electronic fuse line with modified cap | Ronald G. Filippi, John A. Fitzsimmons, Erdem Kaltalioglu, Lijuan Zhang | 2014-11-18 |
| 8853693 | Test structure for determination of TSV depth | Hanyi Ding, Kai D. Feng, Zhijian Yang | 2014-10-07 |
| 8815669 | Metal gate structures for CMOS transistor devices having reduced parasitic capacitance | Jin Cai, Chengwen Pei, Robert R. Robison | 2014-08-26 |
| 8779838 | Methodology and apparatus for tuning driving current of semiconductor transistors | Zhijian Yang, Kai D. Feng, Edwin J. Hostetter, Jr. | 2014-07-15 |
| 8765568 | Method of fabricating thermally controlled refractory metal resistor | Joseph M. Lukaitis, Deborah M. Massey, Timothy D. Sullivan, Kimball M. Watson | 2014-07-01 |
| 8759175 | Flash memory structure with enhanced capacitive coupling coefficient ratio (CCCR) and method for fabrication thereof | Louis C. Hsu, Xu Ouyang, Zhijian Yang | 2014-06-24 |
| 8759152 | Configurable interposer | Oleg Gluschenkov, Yunsheng Song, Tso-Hui Ting | 2014-06-24 |
| 8742782 | Noncontact electrical testing with optical techniques | Xu Ouyang, Tso-Hui Ting, Yongchun Xin | 2014-06-03 |
| 8742766 | Stacked via structure for metal fuse applications | Griselda Bonilla, Kaushik Chanda, Ronald G. Filippi, Stephan Grunow, Naftali E. Lustig +1 more | 2014-06-03 |
| 8716101 | Structure and method of reducing electromigration cracking and extrusion effects in semiconductor devices | Kaushik Chandra, Ronald G. Filippi, Wai-Kin Li, Chih-Chao Yang | 2014-05-06 |
| 8716071 | Methods and systems involving electrically reprogrammable fuses | Kaushik Chanda, Lynne M. Gignac, Wai-Kin Li | 2014-05-06 |
| 8687445 | Self-repair integrated circuit and repair method | Louis L. Hsu, Rajiv V. Joshi, Zhijian Yang | 2014-04-01 |
| 8685817 | Metal gate structures for CMOS transistor devices having reduced parasitic capacitance | Jin Cai, Chengwen Pei, Robert R. Robison | 2014-04-01 |