Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9780007 | LCR test circuit structure for detecting metal gate defect conditions | Xu Ouyang, Yunsheng Song, Yongchun Xin | 2017-10-03 |
| 9702930 | Semiconductor wafer probing system including pressure sensing and control unit | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Ping-Chuan Wang, Yongchun Xin | 2017-07-11 |
| 9524930 | Configurable interposer | Oleg Gluschenkov, Yunsheng Song, Ping-Chuan Wang | 2016-12-20 |
| 9354252 | Pressure sensing and control for semiconductor wafer probing | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Ping-Chuan Wang, Yongchun Xin | 2016-05-31 |
| 9151781 | Yield enhancement for stacked chips through rotationally-connecting-interposer | Oleg Gluschenkov, Muthukumarasamy Karthikeyan, Yunsheng Song, Richard P. Volant, Ping-Chuan Wang | 2015-10-06 |
| 8963567 | Pressure sensing and control for semiconductor wafer probing | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Ping-Chuan Wang, Yongchun Xin | 2015-02-24 |
| 8759152 | Configurable interposer | Oleg Gluschenkov, Yunsheng Song, Ping-Chuan Wang | 2014-06-24 |
| 8742782 | Noncontact electrical testing with optical techniques | Xu Ouyang, Ping-Chuan Wang, Yongchun Xin | 2014-06-03 |
| 8489225 | Wafer alignment system with optical coherence tomography | Yongchun Xin, Xu Ouyang, Yunsheng Song | 2013-07-16 |
| 8429193 | Security control of analysis results | Yunsheng Song, Brian Trapp | 2013-04-23 |
| 8299809 | In-line characterization of a device under test | Ping-Chuan Wang, Mohammed I. Younus | 2012-10-30 |
| 8237278 | Configurable interposer | Oleg Gluschenkov, Yunsheng Song, Ping-Chuan Wang | 2012-08-07 |
| 8159247 | Yield enhancement for stacked chips through rotationally-connecting-interposer | Oleg Gluschenkov, Muthukumarasamy Karthikeyan, Yunsheng Song, Richard P. Volant, Ping-Chuan Wang | 2012-04-17 |
| 7908023 | Method of establishing a lot grade system for product lots in a semiconductor manufacturing process | Edward J. Crawford, Yunsheng Song | 2011-03-15 |
| 7856332 | Real time system for monitoring the commonality, sensitivity, and repeatability of test probes | Muthukumarasamy Karthikeyan, Louis V. Medina, Yunsheng Song, Ping-Chuan Wang | 2010-12-21 |