| 9780007 |
LCR test circuit structure for detecting metal gate defect conditions |
Xu Ouyang, Yunsheng Song, Yongchun Xin |
2017-10-03 |
| 9702930 |
Semiconductor wafer probing system including pressure sensing and control unit |
Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Ping-Chuan Wang, Yongchun Xin |
2017-07-11 |
| 9524930 |
Configurable interposer |
Oleg Gluschenkov, Yunsheng Song, Ping-Chuan Wang |
2016-12-20 |
| 9354252 |
Pressure sensing and control for semiconductor wafer probing |
Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Ping-Chuan Wang, Yongchun Xin |
2016-05-31 |
| 9151781 |
Yield enhancement for stacked chips through rotationally-connecting-interposer |
Oleg Gluschenkov, Muthukumarasamy Karthikeyan, Yunsheng Song, Richard P. Volant, Ping-Chuan Wang |
2015-10-06 |
| 8963567 |
Pressure sensing and control for semiconductor wafer probing |
Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Ping-Chuan Wang, Yongchun Xin |
2015-02-24 |
| 8759152 |
Configurable interposer |
Oleg Gluschenkov, Yunsheng Song, Ping-Chuan Wang |
2014-06-24 |
| 8742782 |
Noncontact electrical testing with optical techniques |
Xu Ouyang, Ping-Chuan Wang, Yongchun Xin |
2014-06-03 |
| 8489225 |
Wafer alignment system with optical coherence tomography |
Yongchun Xin, Xu Ouyang, Yunsheng Song |
2013-07-16 |
| 8429193 |
Security control of analysis results |
Yunsheng Song, Brian Trapp |
2013-04-23 |
| 8299809 |
In-line characterization of a device under test |
Ping-Chuan Wang, Mohammed I. Younus |
2012-10-30 |
| 8237278 |
Configurable interposer |
Oleg Gluschenkov, Yunsheng Song, Ping-Chuan Wang |
2012-08-07 |
| 8159247 |
Yield enhancement for stacked chips through rotationally-connecting-interposer |
Oleg Gluschenkov, Muthukumarasamy Karthikeyan, Yunsheng Song, Richard P. Volant, Ping-Chuan Wang |
2012-04-17 |
| 7908023 |
Method of establishing a lot grade system for product lots in a semiconductor manufacturing process |
Edward J. Crawford, Yunsheng Song |
2011-03-15 |
| 7856332 |
Real time system for monitoring the commonality, sensitivity, and repeatability of test probes |
Muthukumarasamy Karthikeyan, Louis V. Medina, Yunsheng Song, Ping-Chuan Wang |
2010-12-21 |
