Robert D. Edwards — 11 Patents at IBM

Robert D. Edwards has been granted 11 US patents while listed as an inventor at IBM. The first was granted in 1998 and the most recent in July 2017. Robert D. Edwards ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Robert D. Edwards in Marlboro, NY, US.

Patents per Year

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Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
9702930	Semiconductor wafer probing system including pressure sensing and control unit	Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang, Yongchun Xin	2017-07-11	$1,748,000
9673089	Interconnect structure with enhanced reliability	Griselda Bonilla, Kaushik Chanda, Ronald G. Filippi, Andrew H. Simon, Ping-Chuan Wang	2017-06-06
9354252	Pressure sensing and control for semiconductor wafer probing	Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang, Yongchun Xin	2016-05-31	$4,553,000
9059111	Reliable back-side-metal structure	Jeffrey P. Gambino, Charles F. Musante, Ping-Chuan Wang	2015-06-16	$2,098,000
8963567	Pressure sensing and control for semiconductor wafer probing	Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang, Yongchun Xin	2015-02-24	$3,851,000
8912658	Interconnect structure with enhanced reliability	Ronald G. Filippi, Ping-Chuan Wang, Griselda Bonilla, Kaushik Chanda, Andrew H. Simon	2014-12-16	$3,695,000
8053257	Method for prediction of premature dielectric breakdown in a semiconductor	Kaushik Chanda, Hazara S. Rathore, Paul S. McLaughlin, Lawrence A. Clevenger, Andrew P. Cowley +2 more	2011-11-08	$3,097,000
7919834	Edge seal for thru-silicon-via technology	Robert Edgar Davis, J. Edwin Hostetter, Ping-Chuan Wang, Kimball M. Watson	2011-04-05	$6,033,000
7602265	Apparatus for accurate and efficient quality and reliability evaluation of micro electromechanical systems	Hariklia Deligianni, Thomas J. Fleischman, Robert A. Groves, Charles J. Montrose, Richard P. Volant +1 more	2009-10-13	$16,422,000
6383920	Process of enclosing via for improved reliability in dual damascene interconnects	Ping-Chuan Wang, Ronald G. Filippi, Edward W. Kiewra, Roy Iggulden	2002-05-07	$13,479,000
5760595	High temperature electromigration stress test system, test socket, and use thereof	Du Nguyen, James J. Poulin, Hazara S. Rathore, Richard G. Smith	1998-06-02	$5,806,000

Robert D. Edwards — 11 Patents

Patents per Year

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