Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9772371 | Voltage-driven intelligent characterization bench for semiconductor | Ping-Chuan Wang | 2017-09-26 |
| 9460814 | Memory tester design for soft error rate (SER) failure analysis | Joshua M. Dragula | 2016-10-04 |
| 9043179 | Voltage-driven intelligent characterization bench for semiconductor | Ping-Chuan Wang | 2015-05-26 |
| 9006827 | Radiation hardened memory cell and design structures | John G. Massey, Scott J. McAllister, Stewart E. Rauch, III | 2015-04-14 |
| 8615373 | Voltage driver for a voltage-driven intelligent characterization bench for semiconductor | — | 2013-12-24 |
| 7602265 | Apparatus for accurate and efficient quality and reliability evaluation of micro electromechanical systems | Hariklia Deligianni, Robert D. Edwards, Thomas J. Fleischman, Robert A. Groves, Richard P. Volant +1 more | 2009-10-13 |
| 6940285 | Method and apparatus for testing a micro electromechanical device | Ping-Chuan Wang | 2005-09-06 |
| 6611146 | Stress testing for semiconductor devices | — | 2003-08-26 |
| 6598182 | Electromigration and extrusion monitor and control system | Nicholas J. Lowitz | 2003-07-22 |
| 6437956 | Circuit for bipolar transistor stress and qualification | — | 2002-08-20 |
| 6429641 | Power booster and current measuring unit | — | 2002-08-06 |
| 6429677 | Method and apparatus for characterization of gate dielectrics | — | 2002-08-06 |
| 6036358 | System and method for diagnosing mechanical clocks | — | 2000-03-14 |