Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6037795 | Multiple device test layout | Ronald G. Filippi, Robert D. Raviart, Kenneth P. Rodbell, Richard G. Smith, Timothy D. Sullivan +1 more | 2000-03-14 |
| 5760595 | High temperature electromigration stress test system, test socket, and use thereof | Robert D. Edwards, Du Nguyen, Hazara S. Rathore, Richard G. Smith | 1998-06-02 |