Issued Patents All Time
Showing 1–25 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D1055987 | Lawn mower | Yimin Wen, Qiang Liu, Xiaodan Wang, Huachao Teng, Cuibao Wang +4 more | 2024-12-31 |
| D1055988 | Lawn mower | Yimin Wen, Qiang Liu, Xiaodan Wang, Huachao Teng, Cuibao Wang +4 more | 2024-12-31 |
| 10109046 | Methods of detecting faults in real-time for semiconductor wafers | Robert Boyd Finlay | 2018-10-23 |
| 9780007 | LCR test circuit structure for detecting metal gate defect conditions | Xu Ouyang, Tso-Hui Ting, Yongchun Xin | 2017-10-03 |
| 9559051 | Method for manufacturing in a semiconductor device a low resistance via without a bottom liner | Yongchun Xin, Jang Sim, Junjing Bao, Zhigang Song | 2017-01-31 |
| 9524930 | Configurable interposer | Oleg Gluschenkov, Tso-Hui Ting, Ping-Chuan Wang | 2016-12-20 |
| 9519210 | Voltage contrast characterization structures and methods for within chip process variation characterization | Oliver D. Patterson, Zhigang Song, Yongchun Xin | 2016-12-13 |
| 9337334 | Semiconductor memory device employing a ferromagnetic gate | Hari V. Mallela, Edward J. Nowak, Reinaldo Vega, Keith Kwong Hon Wong, Zhijian Yang | 2016-05-10 |
| 9151781 | Yield enhancement for stacked chips through rotationally-connecting-interposer | Oleg Gluschenkov, Muthukumarasamy Karthikeyan, Tso-Hui Ting, Richard P. Volant, Ping-Chuan Wang | 2015-10-06 |
| 9029234 | Physical design symmetry and integrated circuits enabling three dimentional (3D) yield optimization for wafer to wafer stacking | John M. Safran, Daniel Jacob Fainstein, Gary W. Maier, Norman W. Robson | 2015-05-12 |
| 8803328 | Random coded integrated circuit structures and methods of making random coded integrated circuit structures | Keith Kwong Hon Wong, Yongchun Xin, Zhijian Yang | 2014-08-12 |
| 8759152 | Configurable interposer | Oleg Gluschenkov, Tso-Hui Ting, Ping-Chuan Wang | 2014-06-24 |
| 8489225 | Wafer alignment system with optical coherence tomography | Yongchun Xin, Xu Ouyang, Tso-Hui Ting | 2013-07-16 |
| 8429193 | Security control of analysis results | Tso-Hui Ting, Brian Trapp | 2013-04-23 |
| 8369976 | Method for compensating for tool processing variation in the routing of wafers/lots | Keith Kwong Hon Wong, Xu Ouyang | 2013-02-05 |
| 8340800 | Monitoring a process sector in a production facility | William J. Cote, Michael P. Guse, Mark E. Lagus, James Rice | 2012-12-25 |
| 8294485 | Detecting asymmetrical transistor leakage defects | Xu Ouyang, Yun-Yu Wang | 2012-10-23 |
| 8237278 | Configurable interposer | Oleg Gluschenkov, Tso-Hui Ting, Ping-Chuan Wang | 2012-08-07 |
| 8234001 | Tool commonality and stratification analysis to enhance a production process | James Rice, Dustin K. Slisher | 2012-07-31 |
| 8159247 | Yield enhancement for stacked chips through rotationally-connecting-interposer | Oleg Gluschenkov, Muthukumarasamy Karthikeyan, Tso-Hui Ting, Richard P. Volant, Ping-Chuan Wang | 2012-04-17 |
| 8108803 | Geometry based electrical hotspot detection in integrated circuit layouts | Fook-Luen Heng, Xu Ouyang, Yun-Yu Wang | 2012-01-31 |
| 8095230 | Method for optimizing the routing of wafers/lots based on yield | Xu Ouyang, Oleg Gluschenkov, Keith Kwong Hon Wong | 2012-01-10 |
| 8015040 | Methods, systems, and computer program products for product randomization and analysis in a manufacturing environment | Susan M. Cianfrani, Christopher W. Long, Brad J. Rawlins, James Rice | 2011-09-06 |
| 8005560 | Method of optimizing queue times in a production cycle | Brad J. Rawlins, James Rice, Yutong Wu | 2011-08-23 |
| 7962234 | Multidimensional process window optimization in semiconductor manufacturing | Xu Ouyang, James Rice | 2011-06-14 |