Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9064972 | Method of forming a gated diode structure for eliminating RIE damage from cap removal | Anthony I. Chou, Arvind Kumar, Edward P. Maciejewski, Shreesh Narasimha | 2015-06-23 |
| 8980720 | eFUSE and method of fabrication | Edward P. Maciejewski, Stefan Zollner | 2015-03-17 |
| 8912626 | eFuse and method of fabrication | Edward P. Maciejewski, Stefan Zollner | 2014-12-16 |
| 8912630 | Integrated circuit including thermal gate, related method and design structure | Jed H. Rankin, Robert R. Robison | 2014-12-16 |
| 8779551 | Gated diode structure for eliminating RIE damage from cap removal | Anthony I. Chou, Arvind Kumar, Edward P. Maciejewski, Shreesh Narasimha | 2014-07-15 |
| 8652922 | Compact thermally controlled thin film resistors utilizing substrate contacts and methods of manufacture | Joseph M. Lukaitis, Jed H. Rankin, Robert R. Robison, Timothy D. Sullivan | 2014-02-18 |
| 8610217 | Self-protected electrostatic discharge field effect transistor (SPESDFET), an integrated circuit incorporating the SPESDFET as an input/output (I/O) pad driver and associated methods of forming the SPESDFET and the integrated circuit | Robert J. Gauthier, Jr., Mahender Kumar, Junjun Li | 2013-12-17 |
| 8541864 | Compact thermally controlled thin film resistors utilizing substrate contacts and methods of manufacture | Joseph M. Lukaitis, Jed H. Rankin, Robert R. Robison, Timothy D. Sullivan | 2013-09-24 |
| 8486796 | Thin film resistors and methods of manufacture | David L. Harmon, Joseph M. Lukaitis, Stewart E. Rauch, III, Robert R. Robison, Jeffrey H. Sloan +2 more | 2013-07-16 |
| 8298904 | Compact thermally controlled thin film resistors utilizing substrate contacts and methods of manufacture | Joseph M. Lukaitis, Jed H. Rankin, Robert R. Robison, Timothy D. Sullivan | 2012-10-30 |
| 8234001 | Tool commonality and stratification analysis to enhance a production process | James Rice, Yunsheng Song | 2012-07-31 |
| 7381577 | Early detection test for identifying defective semiconductor wafers in a front-end manufacturing line | — | 2008-06-03 |