Issued Patents All Time
Showing 26–30 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7953680 | Computer program product for excluding variations attributable to equipment used in semiconductor wafer manufacturing from split analysis procedures | Xu Ouyang | 2011-05-31 |
| 7908023 | Method of establishing a lot grade system for product lots in a semiconductor manufacturing process | Edward J. Crawford, Tso-Hui Ting | 2011-03-15 |
| 7856332 | Real time system for monitoring the commonality, sensitivity, and repeatability of test probes | Muthukumarasamy Karthikeyan, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang | 2010-12-21 |
| 7682842 | Method of adaptively selecting chips for reducing in-line testing in a semiconductor manufacturing line | Rao H. Desineni, Xu Ouyang, Hargurpreet Singh, Stephen Wu | 2010-03-23 |
| 7337033 | Data mining to detect performance quality of tools used repetitively in manufacturing | Viorel Ontalus, Jeong Woo Nam | 2008-02-26 |