Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 8340800 | Monitoring a process sector in a production facility | William J. Cote, Michael P. Guse, James Rice, Yunsheng Song | 2012-12-25 | |
| 6656369 | Method for fabricating a scanning probe microscope probe | Mahadevaiyer Krishnan, Kevin S. Petrarca, James G. Ryan, Richard P. Volant | 2003-12-02 | $4,756,000 |
| 6004706 | Etching parameter control system process | Christopher P. Ausschnitt, Timothy A. Brunner | 1999-12-21 | $22,815,000 |
| 5969273 | Method and apparatus for critical dimension and tool resolution determination using edge width | Charles N. Archie, Diana Nyyssonen, deceased, by Jeffrey Swing, executor, Eric P. Solecky, Donald C. Wheeler | 1999-10-19 | $17,852,000 |
| 5965309 | Focus or exposure dose parameter control system using tone reversing patterns | Christopher P. Ausschnitt, Timothy A. Brunner | 1999-10-12 | $40,366,000 |