JF

Johnathan E. Faltermeier

IBM: 62 patents #1,257 of 70,183Top 2%
Infineon Technologies Ag: 8 patents #2,021 of 7,486Top 30%
Globalfoundries: 7 patents #504 of 4,424Top 15%
SA Siemens Aktiengesellschaft: 1 patents #10,653 of 22,248Top 50%
📍 San Jose, CA: #619 of 32,062 inventorsTop 2%
🗺 California: #5,035 of 386,348 inventorsTop 2%
Overall (All Time): #33,916 of 4,157,543Top 1%
65
Patents All Time

Issued Patents All Time

Showing 26–50 of 65 patents

Patent #TitleCo-InventorsDate
8492817 Highly scalable trench capacitor Kangguo Cheng, Anne Marie Ebert 2013-07-23
8420464 Spacer as hard mask scheme for in-situ doping in CMOS finFETs Veeraraghavan S. Basker, Kangguo Cheng, Bruce B. Doris, Sivananda K. Kanakasabapathy, Hemant Adhikari 2013-04-16
8367544 Self-aligned patterned etch stop layers for semiconductor devices Kangguo Cheng, Lawrence A. Clevenger, Stephan Grunow, Kaushik A. Kumar, Kevin S. Petrarca 2013-02-05
8288218 Device structure, layout and fabrication method for uniaxially strained transistors Stephen W. Bedell, Huiming Bu, Kangguo Cheng, Bruce B. Doris, Ali Khakifirooz +2 more 2012-10-16
8268729 Smooth and vertical semiconductor fin structure Kangguo Cheng, Bruce B. Doris, Ying Zhang 2012-09-18
8216893 Stress enhanced transistor devices and methods of making Judson R. Holt, Xuefeng Hua 2012-07-10
7993999 High-K/metal gate CMOS finFET with improved pFET threshold voltage Veeraraghavan S. Basker, Kangguo Cheng, Bruce B. Doris, Ali Khakifirooz 2011-08-09
7951657 Method of forming a planar field effect transistor with embedded and faceted source/drain stressors on a silicon-on-insulator (S0I) wafer, a planar field effect transistor structure and a design structure for the planar field effect transistor Kangguo Cheng, Toshiharu Furukawa, Xuefeng Hua 2011-05-31
7932136 Source/drain junction for high performance MOSFET formed by selective EPI process Xuefeng Hua, Toshiharu Furukawa, Oleg Gluschenkov 2011-04-26
7923815 DRAM having deep trench capacitors with lightly doped buried plates Geng Wang, Kangguo Cheng, Paul C. Parries 2011-04-12
7893480 Trench memory with self-aligned strap formed by self-limiting process Xi Li, Kangguo Cheng 2011-02-22
7888252 Self-aligned contact Stephan Grunow, Kangguo Cheng, Kevin S. Petrarca, Kaushik A. Kumar, Lawrence A. Clevenger +2 more 2011-02-15
7833872 Uniform recess of a material in a trench independent of incoming topography Kangguo Cheng, Xi Li 2010-11-16
7749835 Trench memory with self-aligned strap formed by self-limiting process Xi Li, Kangguo Cheng 2010-07-06
7705386 Providing isolation for wordline passing over deep trench capacitor Kangguo Cheng, Herbert L. Ho, Paul C. Parries 2010-04-27
7547608 Polysilicon hard mask for enhanced alignment signal Kangguo Cheng, James P. Norum 2009-06-16
7494891 Trench capacitor with void-free conductor fill Kangguo Cheng, Xi Li 2009-02-24
7394131 STI formation in semiconductor device including SOI and bulk silicon regions Michael D. Steigerwalt, Mahender Kumar, Herbert L. Ho, David M. Dobuzinsky, Denise Pendleton 2008-07-01
7193262 Low-cost deep trench decoupling capacitor device and process of manufacture Herbert L. Ho, John E. Barth, Jr., Ramachandra Divakaruni, Wayne F. Ellis, Brent A. Anderson +4 more 2007-03-20
7118986 STI formation in semiconductor device including SOI and bulk silicon regions Michael D. Steigerwalt, Mahender Kumar, Herbert L. Ho, David M. Dobuzinsky, Denise Pendleton 2006-10-10
7084449 Microelectronic element having trench capacitors with different capacitance values Kangguo Cheng, David R. Hanson, Carl Radens 2006-08-01
6960523 Method of reducing erosion of a nitride gate cap layer during reactive ion etch of nitride liner layer for bit line contact of DRAM device Michael Maldei, Prakash Dev, David M. Dobuzinsky, Thomas Rupp, Chienfan Yu +3 more 2005-11-01
6960514 Pitcher-shaped active area for field effect transistor and method of forming same Jochen Beintner, Rama Divakaruni, Philip L. Flaitz, Oleg Gluschenkov, Carol J. Heenan +5 more 2005-11-01
6893938 STI formation for vertical and planar transistors Munir D. Naeem, Hiroyuki Akatsu, Byeong Y. Kim, Rolf Weis, David Mark Dobuzinksy 2005-05-17
6890815 Reduced cap layer erosion for borderless contacts Jeremy K. Stephens, David M. Dobuzinsky, Larry Clevenger, Munir D. Naeem, Chienfan Yu +3 more 2005-05-10