CL

Christian Lavoie

IBM: 160 patents #258 of 70,183Top 1%
Globalfoundries: 19 patents #170 of 4,424Top 4%
Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
UL Ultratech: 1 patents #58 of 110Top 55%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Pleasantville, NY: #3 of 229 inventorsTop 2%
🗺 New York: #192 of 115,490 inventorsTop 1%
Overall (All Time): #4,569 of 4,157,543Top 1%
174
Patents All Time

Issued Patents All Time

Showing 126–150 of 174 patents

Patent #TitleCo-InventorsDate
7538029 Method of room temperature growth of SiOx on silicide as an etch stop layer for metal contact open of semiconductor devices Yun-Yu Wang, Kevin E. Mello, Conal E. Murray, Matthew Oonk 2009-05-26
7528067 MOSFET structure with multiple self-aligned silicide contacts Kevin K. Chan, Kern Rim 2009-05-05
7517795 Stabilization of Ni monosilicide thin films in CMOS devices using implantation of ions before silicidation Roy A. Carruthers, Cedrik Y. Cole, Christophe Detavernier, Kenneth P. Rodbell 2009-04-14
7501345 Selective silicide formation by electrodeposit displacement reaction Veeraraghaven S. Basker, Hariklia Deligianni, Balasubramanian S. Pranatharthi Haran, James J. Kelly, George G. Totir 2009-03-10
7498254 Plating seed layer including an oxygen/nitrogen transition region for barrier enhancement Chih-Chao Yang, Simon Gaudet, Shom Ponoth, Terry A. Spooner 2009-03-03
7498640 Self-aligned silicide process for silicon sidewall source and drain contacts and structure formed thereby Cyril Cabral, Jr., Kevin K. Chan, Guy M. Cohen, Kathryn Guarini, Paul M. Solomon +1 more 2009-03-03
7491643 Method and structure for reducing contact resistance between silicide contact and overlying metallization Conal E. Murray, Kenneth P. Rodbell 2009-02-17
7449782 Self-aligned metal to form contacts to Ge containing substrates and structure formed thereby Cyril Cabral, Jr., Roy A. Carruthers, Christophe Detavernier, Simon Gaudet, Huiling Shang 2008-11-11
7419907 Eliminating metal-rich silicides using an amorphous Ni alloy silicide structure Christophe Detavernier, Simon Gaudet, Conal E. Murray 2008-09-02
7410852 Opto-thermal annealing methods for forming metal gate and fully silicided gate field effect transistors Scott D. Allen, Cyril Cabral, Jr., Kevin K. Dezfulian, Sunfei Fang, Brian J. Greene +6 more 2008-08-12
7384868 Reduction of silicide formation temperature on SiGe containing substrates Cyril Cabral, Jr., Roy A. Carruthers, Jia Chen, Christophe Detavernier, James M. E. Harper 2008-06-10
7271486 Retarding agglomeration of Ni monosilicide using Ni alloys Cyril Cabral, Jr., Roy A. Carruthers, Christophe Detavernier, James M. E. Harper 2007-09-18
7215006 Plating seed layer including an oxygen/nitrogen transition region for barrier enhancement Chih-Chao Yang, Simon Gaudet, Shom Ponoth, Terry A. Spooner 2007-05-08
7208414 Method for enhanced uni-directional diffusion of metal and subsequent silicide formation Anthony G. Domenicucci, Bradley P. Jones, Robert J. Purtell, Yun-Yu Wang, Kwong Hon Wong 2007-04-24
7129548 MOSFET structure with multiple self-aligned silicide contacts Kevin K. Chan, Kern Rim 2006-10-31
7129169 Method for controlling voiding and bridging in silicide formation Bradley P. Jones, Robert J. Purtell, Yun-Yu Wang, Keith Kwong Hon Wong 2006-10-31
7122472 Method for forming self-aligned dual fully silicided gates in CMOS devices Sunfei Fang, Cyril Cabral, Jr., Chester T. Dziobkowski, Clement Wann 2006-10-17
7119012 Stabilization of Ni monosilicide thin films in CMOS devices using implantation of ions before silicidation Roy A. Carruthers, CEDRIK COIA, Christophe Detavernier, Kenneth P. Rodbell 2006-10-10
7112481 Method for forming self-aligned dual salicide in CMOS technologies Sunfei Fang, Cyril Cabral, Jr., Chester T. Dziobkowski, John J. Ellis-Monaghan, Zhijiong Luo +3 more 2006-09-26
7102234 Method and structure for reduction of contact resistance of metal silicides using a metal-germanium alloy Cyril Cabral, Jr., Roy A. Carruthers, James M. E. Harper, Ronnen Andrew Roy, Yun-Yu Wang 2006-09-05
7081676 Structure for controlling the interface roughness of cobalt disilicide Paul D. Agnello, Cyril Cabral, Jr., Roy A. Carruthers, James M. E. Harper, Kirk D. Peterson +4 more 2006-07-25
7074684 Elevated source drain disposable spacer CMOS Ronnen Andrew Roy, Cyril Cabral, Jr., Kam-Leung Lee 2006-07-11
7067368 Method for forming self-aligned dual salicide in CMOS technologies Sunfei Fang, Cyril Cabral, Jr., Chester T. Dziobkowski, John J. Ellis-Monaghan, Zhijiong Luo +3 more 2006-06-27
7064025 Method for forming self-aligned dual salicide in CMOS technologies Sunfei Fang, Cyril Cabral, Jr., Chester T. Dziobkowski, John J. Ellis-Monaghan, Zhijiong Luo +3 more 2006-06-20
6989322 Method of forming ultra-thin silicidation-stop extensions in mosfet devices Oleg Gluschenkov, Cyril Cabral, Jr., Omer H. Dokumaci 2006-01-24