Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9892920 | Low stress bonding of silicon or germanium parts | Jihong Chen, Joseph P. Doench | 2018-02-13 |
| 8658500 | Single crystal U-MOS gates using microwave crystal regrowth | Steve Sapp | 2014-02-25 |
| 8569183 | Low temperature dielectric flow using microwaves | — | 2013-10-29 |
| 8298385 | Method and apparatus for forming nickel silicide with low defect density in FET devices | Keith Kwong Hon Wong | 2012-10-30 |
| 8143125 | Structure and method for forming a salicide on the gate electrode of a trench-gate FET | James J. Murphy | 2012-03-27 |
| 7759741 | Method and apparatus for forming nickel silicide with low defect density in FET devices | Keith Kwong Hon Wong | 2010-07-20 |
| 7696034 | Methods of base formation in a BiCOMS process | Peter J. Geiss, Marwan H. Khater, Qizhi Liu, Randy W. Mann, Beth Ann Rainey +2 more | 2010-04-13 |
| 7659199 | Air break for improved silicide formation with composite caps | Keith Kwong Hon Wong | 2010-02-09 |
| 7622386 | Method for improved formation of nickel silicide contacts in semiconductor devices | Anita Madan, Keith Kwong Hon Wong, Jun-Keun Kwak | 2009-11-24 |
| 7504336 | Methods for forming CMOS devices with intrinsically stressed metal silicide layers | Henry K. Utomo, Yun-Yu Wang, Haining Yang | 2009-03-17 |
| 7485572 | Method for improved formation of cobalt silicide contacts in semiconductor devices | Anita Madan, Keith Kwong Hon Wong | 2009-02-03 |
| 7456095 | Method and apparatus for forming nickel silicide with low defect density in FET devices | Keith Kwong Hon Wong | 2008-11-25 |
| 7417290 | Air break for improved silicide formation with composite caps | Keith Kwong Hon Wong | 2008-08-26 |
| 7390721 | Methods of base formation in a BiCMOS process | Peter J. Geiss, Marwan H. Khater, Qizhi Liu, Randy W. Mann, BethAnn Rainey +2 more | 2008-06-24 |
| 7344983 | Clustered surface preparation for silicide and metal contacts | Sadanand V. Deshpande, Ying Li, Kevin E. Mello, Renee T. Mo, Wesley C. Natzle +1 more | 2008-03-18 |
| 7320938 | Method for reducing dendrite formation in nickel silicon salicide processes | Yun-Yu Wang, Keith Kwong Hon Wong | 2008-01-22 |
| 7208414 | Method for enhanced uni-directional diffusion of metal and subsequent silicide formation | Anthony G. Domenicucci, Bradley P. Jones, Christian Lavoie, Yun-Yu Wang, Kwong Hon Wong | 2007-04-24 |
| 7129169 | Method for controlling voiding and bridging in silicide formation | Bradley P. Jones, Christian Lavoie, Yun-Yu Wang, Keith Kwong Hon Wong | 2006-10-31 |
| 7109116 | Method for reducing dendrite formation in nickel silicon salicide processes | Yun-Yu Wang, Keith Kwong Hon Wong | 2006-09-19 |
| 7081676 | Structure for controlling the interface roughness of cobalt disilicide | Paul D. Agnello, Cyril Cabral, Jr., Roy A. Carruthers, James M. E. Harper, Christian Lavoie +4 more | 2006-07-25 |
| 7081208 | Method to build a microfilter | Kenneth McCullough, Wayne M. Moreau, Keith R. Pope, John P. Simons, William A. Syverson +1 more | 2006-07-25 |
| 6965133 | Method of base formation in a BiCMOS process | Peter J. Geiss, Marwan H. Khater, Qizhi Liu, Randy W. Mann, BethAnn Rainey +2 more | 2005-11-15 |
| 6927393 | Method of in situ monitoring of supercritical fluid process conditions | John M. Cotte, Kenneth McCullough, Wayne M. Moreau, Keith R. Pope, John P. Simons +1 more | 2005-08-09 |
| 6875286 | Solid CO2 cleaning | John M. Cotte, Catherine Ivers, Kenneth McCullough, Wayne M. Moreau, John P. Simons +2 more | 2005-04-05 |
| 6809030 | Method and structure for controlling the interface roughness of cobalt disilicide | Paul D. Agnello, Cyril Cabral, Jr., Roy A. Carruthers, James M. E. Harper, Christian Lavoie +4 more | 2004-10-26 |