Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10008421 | Capacitance monitoring using x-ray diffraction | Donghun Kang, Kriteshwar K. Kohli, Oh-Jung Kwon, Conal E. Murray | 2018-06-26 |
| 9870960 | Capacitance monitoring using X-ray diffraction | Donghun Kang, Kriteshwar K. Kohli, Oh-Jung Kwon, Conal E. Murray | 2018-01-16 |
| 9201027 | Evaluating semiconductor wafers for pitch walking and/or epitaxial merge | Kriteshwar K. Kohli, Patrick Edward Lindo, Teresa L. Pinto | 2015-12-01 |
| 8865571 | Dislocation engineering using a scanned laser | Chung Woh Lai, Xiao Hu Liu, Klaus W. Schwarz, J. Campbell Scott | 2014-10-21 |
| 8865572 | Dislocation engineering using a scanned laser | Chung Woh Lai, Xiao Hu Liu, Klaus W. Schwarz, J. Campbell Scott | 2014-10-21 |
| 8716037 | Measurement of CMOS device channel strain by X-ray diffraction | Thomas N. Adam, Stephen W. Bedell, Eric C. Harley, Judson R. Holt, Conal E. Murray +1 more | 2014-05-06 |
| 8138066 | Dislocation engineering using a scanned laser | Chung Woh Lai, Xiao Hu Liu, Klaus W. Schwarz, J. Campbell Scott | 2012-03-20 |
| 8105955 | Integrated circuit system with carbon and non-carbon silicon | Jin Ping Liu, Richard J. Murphy, Ashima B. Chakravarti | 2012-01-31 |
| 7838428 | Method of repairing process induced dielectric damage by the use of GCIB surface treatment using gas clusters of organic molecular species | Shyng-Tsong Chen, Nancy R. Klymko, Sanjay C. Mehta, Steven E. Molis | 2010-11-23 |
| 7804136 | Method of forming nitride films with high compressive stress for improved PFET device performance | Richard A. Conti, Ronald P. Bourque, Nancy R. Klymko, Michael C. Smits, Roy H. Tilghman +2 more | 2010-09-28 |
| 7769134 | Measuring strain of epitaxial films using micro x-ray diffraction for in-line metrology | Thomas N. Adam, Eric C. Harley, Teresa L. Pinto | 2010-08-03 |
| 7622386 | Method for improved formation of nickel silicide contacts in semiconductor devices | Robert J. Purtell, Keith Kwong Hon Wong, Jun-Keun Kwak | 2009-11-24 |
| 7491660 | Method of forming nitride films with high compressive stress for improved PFET device performance | Richard A. Conti, Ronald P. Bourque, Nancy R. Klymko, Michael C. Smits, Roy H. Tilghman +2 more | 2009-02-17 |
| 7485572 | Method for improved formation of cobalt silicide contacts in semiconductor devices | Robert J. Purtell, Keith Kwong Hon Wong | 2009-02-03 |
| 7473608 | N-channel MOSFETs comprising dual stressors, and methods for forming the same | Jinghong Li, Yaocheng Liu, Zhijiong Luo, Nivo Rovedo | 2009-01-06 |
| 7462527 | Method of forming nitride films with high compressive stress for improved PFET device performance | Richard A. Conti, Ronald P. Bourque, Nancy R. Klymko, Michael C. Smits, Roy H. Tilghman +2 more | 2008-12-09 |
| 7407875 | Low resistance contact structure and fabrication thereof | Keith Kwong Hon Wong, Patrick W. DeHaven, Sadanand V. Deshpande | 2008-08-05 |
| 7279758 | N-channel MOSFETs comprising dual stressors, and methods for forming the same | Jinghong Li, Yaocheng Liu, Zhijiong Luo, Nivo Rovedo | 2007-10-09 |
| 7232774 | Polycrystalline silicon layer with nano-grain structure and method of manufacture | Ashima B. Chakravarti, Bruce B. Doris, Romany Ghali, Oleg Gluschenkov, Michael A. Gribelyuk +1 more | 2007-06-19 |
| 7193500 | Thin film resistors of different materials | Anil K. Chinthakindi, Kenneth J. Stein, Kwong Hon Wong | 2007-03-20 |
| 7119016 | Deposition of carbon and nitrogen doped poly silicon films, and retarded boron diffusion and improved poly depletion | Ashima B. Chakravarti, Woo-Hyeong Lee, Gregory DiBello, Ramaseshan Iyer | 2006-10-10 |