Issued Patents All Time
Showing 76–100 of 137 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6348690 | Method and an apparatus of an inspection system using an electron beam | Yuko Iwabuchi, Hiroyoshi Mori, Mitsugu Sato, Yasutsugu Usami, Mikio Ichihashi +6 more | 2002-02-19 |
| 6310341 | Projecting type charged particle microscope and projecting type substrate inspection system | Tohru Ishitani, Yasutsugu Usami, Shunroku Taya, Hiroyuki Shinada, Taku Ninomiya +1 more | 2001-10-30 |
| 6307707 | Narrow track thin film head including magnetic poles machined by focused ion beam etching | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2001-10-23 |
| 6278578 | Narrow track thin film head having a focused ion beam etched air bearing surface | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2001-08-21 |
| 6114695 | Scanning electron microscope and method for dimension measuring by using the same | Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Sadao Terakado +3 more | 2000-09-05 |
| 6111723 | Narrow track thin film magnetic head suitable for high density recording and reproducing operations and fabrication method thereof wherein an air bearing surface has at least one groove containing a non-magnetic electrically conductive layer | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2000-08-29 |
| 6084238 | Scanning electron microscope | Makoto Ezumi | 2000-07-04 |
| 6069356 | Scanning electron microscope | Makoto Ezumi | 2000-05-30 |
| 6051834 | Electron microscope | Hiroshi Kakibayashi, Yasuhiro Mitsui, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji +7 more | 2000-04-18 |
| 6043491 | Scanning electron microscope | Yoichi Ose, Kiyomi Yoshinari, Mitsugu Sato | 2000-03-28 |
| 5969357 | Scanning electron microscope and method for dimension measuring by using the same | Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Sadao Terakado +3 more | 1999-10-19 |
| 5939720 | Scanning electron microscope | — | 1999-08-17 |
| 5929439 | Scanning microscope | Osamu Yamada | 1999-07-27 |
| 5900629 | Scanning electron microscope | Makoto Ezumi | 1999-05-04 |
| 5877498 | Method and apparatus for X-ray analyses | Aritoshi Sugimoto, Yoshimi Sudo, Tokuo Kure, Ken Ninomiya, Katsuhiro Kuroda +3 more | 1999-03-02 |
| 5872358 | Scanning electron microscope | Makoto Ezumi | 1999-02-16 |
| 5866904 | Scanning electron microscope and method for dimension measuring by using the same | Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Sadao Terakado +3 more | 1999-02-02 |
| 5866905 | Electron microscope | Hiroshi Kakibayashi, Yasuhiro Mitsui, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji +7 more | 1999-02-02 |
| 5850326 | Narrow track thin film magnetic head suitable for high density recording and reproducing operations and fabrication method thereof wherein an air bearing surface has at least one groove containing a non-magnetic electrically conductive layer | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 1998-12-15 |
| 5608218 | Scanning electron microscope | Mitsugu Sato, Yoichi Ose, Satoru Fukuhara, Makoto Ezumi | 1997-03-04 |
| 5598002 | Electron beam apparatus | Tadashi Otaka, Tatsuya Maeda, Katsuhiro Sasada | 1997-01-28 |
| 5594246 | Method and apparatus for x-ray analyses | Yoshimi Sudo, Tokuo Kure, Ken Ninomiya, Katsuhiro Kuroda, Takashi Nishida +2 more | 1997-01-14 |
| 5594245 | Scanning electron microscope and method for dimension measuring by using the same | Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Sadao Terakado +3 more | 1997-01-14 |
| 5481109 | Surface analysis method and apparatus for carrying out the same | Ken Ninomiya, Tokuo Kure, Yasuhiro Mitsui, Katsuhiro Kuroda, Hiroyasu Shichi | 1996-01-02 |
| 5475218 | Instrument and method for 3-dimensional atomic arrangement observation | Hiroshi Kakibayashi, Yasuhiro Mitsui, Katsuhiro Kuroda | 1995-12-12 |