Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10379282 | Multicolor display apparatus and method for setting gradation value of multicolor display apparatus | Wahei Agemizu, Kazumasa Takata | 2019-08-13 |
| 10345503 | Display device | Kazumasa Takata, Wahei Agemizu | 2019-07-09 |
| 10338296 | Display apparatus | Kazumasa Takata, Wahei Agemizu | 2019-07-02 |
| 6114695 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Sadao Terakado +3 more | 2000-09-05 |
| 6068382 | Panel-form illuminating system | Atsushi Fukui, Kanji Nishii, Masami Ito, Kazumasa Takata, Ken Tatsuta +2 more | 2000-05-30 |
| 5999249 | Position detecting element and range sensor | Masami Ito, Kanji Nishii, Atsushi Fukui, Kazumasa Takata | 1999-12-07 |
| 5986727 | Back light illuminator for liquid crystal display apparatus | Atsushi Fukui, Kanji Nishii, Masami Ito, Kazumasa Takata | 1999-11-16 |
| 5980054 | Panel-form illuminating system | Atsushi Fukui, Kanji Nishii, Masami Ito, Kazumasa Takata, Ken Tatsuta +2 more | 1999-11-09 |
| 5981941 | Optical encorder for detection having a moving reference point | Kazumasa Takata, Kanji Nishii, Masami Ito, Atsushi Fukui, Tomohisa Kishi | 1999-11-09 |
| 5969357 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Sadao Terakado +3 more | 1999-10-19 |
| 5894345 | Optical method of detecting defect and apparatus used therein | Kanji Nishii, Masami Ito, Atsushi Fukui, Kazumasa Takata | 1999-04-13 |
| 5866904 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Sadao Terakado +3 more | 1999-02-02 |
| 5754341 | Phase grating, its fabricating method, optical encoder, motor using the optical encoder, and robot using the motor | Kazumasa Takata, Kanji Nishii, Masami Ito, Atsushi Fukui | 1998-05-19 |
| 5748305 | Method and apparatus for particle inspection | Ken Shimono, Tatsuo Nagasaki, Masami Ito, Kanji Nishii | 1998-05-05 |
| 5734472 | Method and appratus for measuring thickness of birefringence layer | Masami Ito, Kanji Nishii, Atsushi Fukui | 1998-03-31 |
| 5717485 | Foreign substance inspection apparatus | Masami Ito, Kanji Nishii, Tatsuo Nagasaki, Ken Shimono | 1998-02-10 |
| 5699153 | Method and apparatus for optical inspection | Kanji Nishii, Masami Ito, Atsushi Fukui | 1997-12-16 |
| 5696373 | Optical encoder with dual diffraction grating | Atsushi Fukui, Kanji Nishii, Masami Ito | 1997-12-09 |
| 5696374 | Optical encoder using doubled diffraction angle based on first and second diffraction gratings | Atsushi Fukui, Kanji Nishii, Masami Ito | 1997-12-09 |
| 5694218 | Optical encoder including a plurality of phase adjusting gratings | Atsushi Fukui, Kanji Nishii, Masami Ito, Kazumasa Takata | 1997-12-02 |
| 5661295 | Optical encoder with dual diffraction gratings | Atsushi Fukui, Kanji Nishii, Masami Ito | 1997-08-26 |
| 5627678 | Fourier transform optical apparatus and optical information | Kanji Nishii, Masami Ito, Atsushi Fukui | 1997-05-06 |
| 5594245 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Sadao Terakado +3 more | 1997-01-14 |
| 5532823 | Method of measuring optical characteristics of liquid crystal cells, measurement equipment therefor and method for manufacturing liquid crystal devices | Atsushi Fukui, Kanji Nishii, Masami Ito | 1996-07-02 |
| 5412210 | Scanning electron microscope and method for production of semiconductor device by using the same | Hideo Todokoro, Tadashi Otaka, Fumio Mizuno, Satoru Yamada, Katsuhiro Kuroda +2 more | 1995-05-02 |