Issued Patents All Time
Showing 126–137 of 137 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4751384 | Electron beam metrology system | Hisaya Murakoshi, Mikio Ichihashi | 1988-06-14 |
| 4710632 | Ion microbeam apparatus | Tohru Ishitani, Yoshimi Kawanami, Hifumi Tamura | 1987-12-01 |
| 4687931 | Scanning electron microscope | Satoru Fukuhara | 1987-08-18 |
| 4629889 | Potential analyzer | Satoru Fukuhara | 1986-12-16 |
| 4626690 | Apparatus for chopping a charged particle beam | Tsutomu Komoda | 1986-12-02 |
| 4581534 | Image display system for a stroboscopic scanning electron microscope | Satoru Fukuhara | 1986-04-08 |
| 4554455 | Potential analyzer | Satoru Fukuhara | 1985-11-19 |
| 4382182 | Method of displaying an image of phase contrast in a scanning transmission electron microscope | Takashi Matsuzaka | 1983-05-03 |
| 4379250 | Field emission cathode and method of fabricating the same | Shigeyuki Hosoki, Shigehiko Yamamoto, Susumu Kawase, Yasuharu Hirai | 1983-04-05 |
| 4355232 | Apparatus for measuring specimen potential in electron microscope | Satoru Fukuhara, Yoshio Sakitani | 1982-10-19 |
| 4295072 | Field emission electron gun with anode heater and plural exhausts | Yoshio Sakitani | 1981-10-13 |
| 4274035 | Field emission electron gun | Satoru Fukuhara, Yoshio Sakitani | 1981-06-16 |