TO

Thomas H. Osterheld

Applied Materials: 67 patents #98 of 7,310Top 2%
Overall (All Time): #31,565 of 4,157,543Top 1%
67
Patents All Time

Issued Patents All Time

Showing 25 most recent of 67 patents

Patent #TitleCo-InventorsDate
12403560 Determining substrate precession with acoustic signals Nicholas A. Wiswell, Benjamin Cherian, Jun Qian 2025-09-02
12343840 Control of processing parameters for substrate polishing with substrate precession Eric Lau, Charles C. Garretson, Huanbo Zhang, Zhize Zhu, Benjamin Cherian +1 more 2025-07-01
12257665 Machine vision as input to a CMP process control algorithm Benjamin Cherian, Jun Qian, Nicholas A. Wiswell, Dominic J. Benvegnu, Boguslaw A. Swedek 2025-03-25
12020159 Training spectrum generation for machine learning system for spectrographic monitoring Benjamin Cherian, Nicholas A. Wiswell, Jun Qian 2024-06-25
11931853 Control of processing parameters for substrate polishing with angularly distributed zones using cost function Eric Lau, Charles C. Garretson, Huanbo Zhang, Zhize Zhu, Benjamin Cherian +1 more 2024-03-19
11931860 Consumable part monitoring in chemical mechanical polisher Dominic J. Benvegnu 2024-03-19
11780046 Polishing system with annular platen or polishing pad Paul D. Butterfield, Jeonghoon Oh, Shou-Sung Chang, Steven M. Zuniga, Fred C. Redeker 2023-10-10
11731238 Monitoring of polishing pad texture in chemical mechanical polishing Benjamin Cherian 2023-08-22
11701749 Monitoring of vibrations during chemical mechanical polishing Boguslaw A. Swedek, Dominic J. Benvegnu, Chih Chung Chou, Nicholas A. Wiswell, Jeonghoon Oh 2023-07-18
11699595 Imaging for monitoring thickness in a substrate cleaning system Dominic J. Benvegnu, Jun Qian, Boguslaw A. Swedek 2023-07-11
11651207 Training spectrum generation for machine learning system for spectrographic monitoring Benjamin Cherian, Nicholas A. Wiswell, Jun Qian 2023-05-16
11577356 Machine vision as input to a CMP process control algorithm Benjamin Cherian, Jun Qian, Nicholas A. Wiswell, Dominic J. Benvegnu, Boguslaw A. Swedek 2023-02-14
11571786 Consumable part monitoring in chemical mechanical polisher Dominic J. Benvegnu 2023-02-07
11511388 Polishing system with support post and annular platen or polishing pad Paul D. Butterfield, Jeonghoon Oh, Shou-Sung Chang, Steven M. Zuniga, Fred C. Redeker 2022-11-29
11507824 Training spectrum generation for machine learning system for spectrographic monitoring Benjamin Cherian, Nicholas A. Wiswell, Jun Qian 2022-11-22
11453097 Chemical mechanical polishing apparatus and methods Rajeev Bajaj, Hung Chih Chen, Terrance Y. Lee 2022-09-27
10589399 Textured small pad for chemical mechanical polishing Jeonghoon Oh, Edwin C. Suarez, Jason Garcheung Fung, Eric Lau, King Yi Heung +3 more 2020-03-17
10562147 Polishing system with annular platen or polishing pad for substrate monitoring Paul D. Butterfield, Jeonghoon Oh, Shou-Sung Chang, Steven M. Zuniga, Fred C. Redeker 2020-02-18
10500694 Chemical mechanical polishing apparatus and methods Rajeev Bajaj, Hung Chih Chen, Terrance Y. Lee 2019-12-10
10478937 Acoustic emission monitoring and endpoint for chemical mechanical polishing Jianshe Tang, David Masayuki Ishikawa, Benjamin Cherian, Jeonghoon Oh 2019-11-19
10256111 Chemical mechanical polishing automated recipe generation Eric Lau, King Yi Heung, Charles C. Garretson, Jun Qian, Shuchivrat Datar +1 more 2019-04-09
9242337 Dynamic residue clearing control with in-situ profile control (ISPC) Jun Qian, Sivakumar Dhandapani, Benjamin Cherian, Charles C. Garretson 2016-01-26
9227293 Multi-platen multi-head polishing architecture Jeffrey Drue David, Boguslaw A. Swedek, Doyle E. Bennett, Benjamin Cherian, Dominic J. Benvegnu +3 more 2016-01-05
9221147 Endpointing with selective spectral monitoring Jun Qian, Sivakumar Dhandapani, Benjamin Cherian, Jeffrey Drue David, Gregory E. Menk +2 more 2015-12-29
9138858 Thin polishing pad with window and molding process Dominic J. Benvegnu, Jimin Zhang, Boguslaw A. Swedek 2015-09-22