JQ

Jun Qian

Applied Materials: 45 patents #188 of 7,310Top 3%
Lam Research: 39 patents #52 of 2,128Top 3%
Oracle: 6 patents #2,063 of 14,854Top 15%
IBM: 4 patents #21,733 of 70,183Top 35%
CI Cisco: 3 patents #4,210 of 13,007Top 35%
Huawei: 2 patents #5,439 of 15,535Top 40%
KI Kerry Ingredients: 1 patents #2 of 11Top 20%
KD K.U. Leuven Research & Development: 1 patents #54 of 174Top 35%
Lsi Logic: 1 patents #1,146 of 1,957Top 60%
NE Nec: 1 patents #7,889 of 14,502Top 55%
AM Amazon: 1 patents #10,608 of 19,158Top 60%
SC Shanghai Micro Electronics Equipment (Group) Co.: 1 patents #81 of 212Top 40%
UA Uchicago Argonne: 1 patents #458 of 1,009Top 50%
UM United Microelectronics: 1 patents #2,686 of 4,560Top 60%
XC Xuzhou Coal Mine Safety Equipment Manufacture Co.: 1 patents #15 of 41Top 40%
SM Shanghai Huali Microelectronics: 1 patents #84 of 202Top 45%
CS Cadence Design Systems: 1 patents #1,216 of 2,263Top 55%
CM Chartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
CT China University Of Mining And Technology: 1 patents #288 of 815Top 40%
ET East China University Of Science And Technology: 1 patents #117 of 449Top 30%
KE Kerry: 1 patents #9 of 21Top 45%
Overall (All Time): #10,258 of 4,157,543Top 1%
118
Patents All Time

Issued Patents All Time

Showing 25 most recent of 118 patents

Patent #TitleCo-InventorsDate
12403560 Determining substrate precession with acoustic signals Nicholas A. Wiswell, Benjamin Cherian, Thomas H. Osterheld 2025-09-02
12403561 Eddy current monitoring to detect vibration in polishing Kun Xu, Patrick A. Higashi, Hassan G. Iravani, Harry Q. Lee, Haosheng Wu +4 more 2025-09-02
12374139 Generating synthetic training data including document images with key-value pairs Yazhe Hu, Tao SHENG 2025-07-29
12370646 Polishing apparatus using machine learning and compensation for pad thickness Kun Xu, Denis Ivanov, Harry Q. Lee 2025-07-29
12371025 Autonomous lane change method and apparatus, and storage medium Chen CHEN, Wulong Liu 2025-07-29
12361736 Multi-stage machine learning model training for key-value extraction Yazhe Hu, Jeaff Wang, Mengqing Guo, Tao SHENG 2025-07-15
12354871 Ultrathin atomic layer deposition film accuracy thickness control Hu Kang, Adrien LaVoie, Seiji Matsuyama, Purushottam Kumar 2025-07-08
12272047 Residue measurement from machine learning based processing of substrate images Sivakumar Dhandapani, Arash Alahgholipouromrani, Dominic J. Benvegnu, Kiran Shrestha 2025-04-08
12257665 Machine vision as input to a CMP process control algorithm Benjamin Cherian, Nicholas A. Wiswell, Dominic J. Benvegnu, Boguslaw A. Swedek, Thomas H. Osterheld 2025-03-25
12261038 Gapfill of variable aspect ratio features with a composite PEALD and PECVD method Hu Kang, Shankar Swaminathan, Wanki Kim, Dennis M. Hausmann, Bart J. van Schravendijk +1 more 2025-03-25
D1067472 LED light bulb 2025-03-18
12249170 Vision-based document language identification by joint supervision Liyu Gong, Yuying Wang, Zhonghai Deng, Iman Zadeh 2025-03-11
12230020 Techniques for dynamic time-based custom model generation Olaitan Philip Olaleye, Arunjeyan T V Seshier Venkatachalapathy, Jinghou Zhang 2025-02-18
12169925 System using film thickness estimation from machine learning based processing of substrate images Sivakumar Dhandapani, Arash Alahgholipouromrani, Dominic J. Benvegnu, Kiran Shrestha 2024-12-17
12136574 Technique for training neural network for use in in-situ monitoring during polishing and polishing system Kun Xu, Kiran Shrestha, Doyle E. Bennett, David Maxwell Gage, Benjamin Cherian +1 more 2024-11-05
12099436 Application performance monitoring for monolithic applications and distributed systems Fuheng Wu, Ivan Dimitrov Davchev 2024-09-24
12090599 Determination of substrate layer thickness with polishing pad wear compensation Kun Xu, Benjamin Cherian, Kiran Shrestha 2024-09-17
12077859 Variable cycle and time RF activation method for film thickness matching in a multi-station deposition system Ishtak Karim, Kiyong Cho, Adrien LaVoie, Jaswinder Guliani, Purushottam Kumar 2024-09-03
12057354 Trained neural network in in-situ monitoring during polishing and polishing system Kun Xu, Kiran Shrestha, Doyle E. Bennett, David Maxwell Gage, Benjamin Cherian +1 more 2024-08-06
12020159 Training spectrum generation for machine learning system for spectrographic monitoring Benjamin Cherian, Nicholas A. Wiswell, Thomas H. Osterheld 2024-06-25
11989964 Techniques for graph data structure augmentation Amit Agarwal, Kulbhushan Pachauri, Iman Zadeh 2024-05-21
11989492 Preston matrix generator Sivakumar Dhandapani, Thomas Li 2024-05-21
11970772 Dynamic precursor dosing for atomic layer deposition Purushottam Kumar, Adrien LaVoie, Hu Kang, Ishtak Karim, Fung Suong Ou 2024-04-30
11919748 Hoist for transferred materials in underground auxiliary transportation system and method thereof Chi Ma, Yuxing Peng, Zhencai Zhu, Meilin Wang, Changhua Hu +6 more 2024-03-05
11847776 System using film thickness estimation from machine learning based processing of substrate images Sivakumar Dhandapani, Arash Alahgholipouromrani, Dominic J. Benvegnu, Kiran Shrestha 2023-12-19