Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
JQ

Jun Qian — 118 Patents

Applied Materials: 45 patents #190 of 7,310Top 3%
Lam Research: 39 patents #52 of 2,128Top 3%
Oracle: 6 patents #2,079 of 14,854Top 15%
IBM: 4 patents #21,783 of 70,183Top 35%
Cisco: 3 patents #4,245 of 13,007Top 35%
Huawei: 2 patents #5,512 of 15,535Top 40%
KDK.U. Leuven Research & Development: 1 patents #54 of 174Top 35%
SMShanghai Huali Microelectronics: 1 patents #84 of 202Top 45%
UAUchicago Argonne: 1 patents #458 of 1,009Top 50%
UMUnited Microelectronics: 1 patents #2,686 of 4,560Top 60%
Amazon: 1 patents #10,717 of 19,158Top 60%
Nec: 1 patents #7,928 of 14,502Top 55%
CSCadence Design Systems: 1 patents #1,216 of 2,263Top 55%
LSLsi: 1 patents #2,507 of 3,238Top 80%
CMChartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
CTChina University Of Mining And Technology: 1 patents #288 of 815Top 40%
ETEast China University Of Science And Technology: 1 patents #117 of 449Top 30%
KEKerry: 1 patents #9 of 21Top 45%
KIKerry Ingredients: 1 patents #2 of 11Top 20%
Sunnyvale, CA: #67 of 14,302 inventorsTop 1%
California: #1,641 of 386,348 inventorsTop 1%
Overall (All Time): #10,312 of 4,157,543Top 1%
118 Patents All Time
Jun Qian has been granted 118 US patents while listed as an inventor at Applied Materials. The first was granted in 1998 and the most recent in September 2025. Jun Qian ranks #10,312 of 4,157,543 US inventors in our database (top 0.25%). Patent records list Jun Qian in Sunnyvale, CA, US.

Issued Patents All Time

Showing 1–25 of 118 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12403560 Determining substrate precession with acoustic signals Nicholas A. Wiswell, Benjamin Cherian, Thomas H. Osterheld 2025-09-02
12403561 Eddy current monitoring to detect vibration in polishing Kun Xu, Patrick A. Higashi, Hassan G. Iravani, Harry Q. Lee, Haosheng Wu +4 more 2025-09-02
12374139 Generating synthetic training data including document images with key-value pairs Yazhe Hu, Tao SHENG 2025-07-29
12370646 Polishing apparatus using machine learning and compensation for pad thickness Kun Xu, Denis Ivanov, Harry Q. Lee 2025-07-29
12371025 Autonomous lane change method and apparatus, and storage medium Chen CHEN, Wulong Liu 2025-07-29
12361736 Multi-stage machine learning model training for key-value extraction Yazhe Hu, Jeaff Wang, Mengqing Guo, Tao SHENG 2025-07-15
12354871 Ultrathin atomic layer deposition film accuracy thickness control Hu Kang, Adrien LaVoie, Seiji Matsuyama, Purushottam Kumar 2025-07-08
12272047 Residue measurement from machine learning based processing of substrate images Sivakumar Dhandapani, Arash Alahgholipouromrani, Dominic J. Benvegnu, Kiran Shrestha 2025-04-08
12261038 Gapfill of variable aspect ratio features with a composite PEALD and PECVD method Hu Kang, Shankar Swaminathan, Wanki Kim, Dennis M. Hausmann, Bart J. van Schravendijk +1 more 2025-03-25
12257665 Machine vision as input to a CMP process control algorithm Benjamin Cherian, Nicholas A. Wiswell, Dominic J. Benvegnu, Boguslaw A. Swedek, Thomas H. Osterheld 2025-03-25
D1067472 LED light bulb 2025-03-18
12249170 Vision-based document language identification by joint supervision Liyu Gong, Yuying Wang, Zhonghai Deng, Iman Zadeh 2025-03-11
12230020 Techniques for dynamic time-based custom model generation Olaitan Philip Olaleye, Arunjeyan T V Seshier Venkatachalapathy, Jinghou Zhang 2025-02-18
12169925 System using film thickness estimation from machine learning based processing of substrate images Sivakumar Dhandapani, Arash Alahgholipouromrani, Dominic J. Benvegnu, Kiran Shrestha 2024-12-17 $116,184,000
12136574 Technique for training neural network for use in in-situ monitoring during polishing and polishing system Kun Xu, Kiran Shrestha, Doyle E. Bennett, David Maxwell Gage, Benjamin Cherian +1 more 2024-11-05 $79,202,000
12099436 Application performance monitoring for monolithic applications and distributed systems Fuheng Wu, Ivan Dimitrov Davchev 2024-09-24 $195,762,000
12090599 Determination of substrate layer thickness with polishing pad wear compensation Kun Xu, Benjamin Cherian, Kiran Shrestha 2024-09-17 $46,375,000
12077859 Variable cycle and time RF activation method for film thickness matching in a multi-station deposition system Ishtak Karim, Kiyong Cho, Adrien LaVoie, Jaswinder Guliani, Purushottam Kumar 2024-09-03 $105,811,000
12057354 Trained neural network in in-situ monitoring during polishing and polishing system Kun Xu, Kiran Shrestha, Doyle E. Bennett, David Maxwell Gage, Benjamin Cherian +1 more 2024-08-06 $90,312,000
12020159 Training spectrum generation for machine learning system for spectrographic monitoring Benjamin Cherian, Nicholas A. Wiswell, Thomas H. Osterheld 2024-06-25 $57,214,000
11989964 Techniques for graph data structure augmentation Amit Agarwal, Kulbhushan Pachauri, Iman Zadeh 2024-05-21 $202,049,000
11989492 Preston matrix generator Sivakumar Dhandapani, Thomas Li 2024-05-21 $57,593,000
11970772 Dynamic precursor dosing for atomic layer deposition Purushottam Kumar, Adrien LaVoie, Hu Kang, Ishtak Karim, Fung Suong Ou 2024-04-30 $255,527,000
11919748 Hoist for transferred materials in underground auxiliary transportation system and method thereof Chi Ma, Yuxing Peng, Zhencai Zhu, Meilin Wang, Changhua Hu +6 more 2024-03-05
11847776 System using film thickness estimation from machine learning based processing of substrate images Sivakumar Dhandapani, Arash Alahgholipouromrani, Dominic J. Benvegnu, Kiran Shrestha 2023-12-19 $56,890,000