Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12272047 | Residue measurement from machine learning based processing of substrate images | Sivakumar Dhandapani, Dominic J. Benvegnu, Jun Qian, Kiran Shrestha | 2025-04-08 |
| 12169925 | System using film thickness estimation from machine learning based processing of substrate images | Sivakumar Dhandapani, Dominic J. Benvegnu, Jun Qian, Kiran Shrestha | 2024-12-17 |
| 11847776 | System using film thickness estimation from machine learning based processing of substrate images | Sivakumar Dhandapani, Dominic J. Benvegnu, Jun Qian, Kiran Shrestha | 2023-12-19 |
| 11836913 | Film thickness estimation from machine learning based processing of substrate images | Sivakumar Dhandapani, Dominic J. Benvegnu, Jun Qian, Kiran Shrestha | 2023-12-05 |