DG

David Maxwell Gage

Applied Materials: 12 patents #1,120 of 7,310Top 20%
Overall (All Time): #400,728 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12136574 Technique for training neural network for use in in-situ monitoring during polishing and polishing system Kun Xu, Kiran Shrestha, Doyle E. Bennett, Benjamin Cherian, Jun Qian +1 more 2024-11-05
12057354 Trained neural network in in-situ monitoring during polishing and polishing system Kun Xu, Kiran Shrestha, Doyle E. Bennett, Benjamin Cherian, Jun Qian +1 more 2024-08-06
11948885 Methods and apparatus for forming dual metal interconnects Suketu Arun Parikh, Rong Tao, Roey Shaviv, Joung Joo Lee, Seshadri Ganguli +3 more 2024-04-02
11865664 Profile control with multiple instances of contol algorithm during polishing Kun Xu, Harry Q. Lee, Benjamin Cherian 2024-01-09
11850699 Switching control algorithms on detection of exposure of underlying layer during polishing Kun Xu, Harry Q. Lee, Benjamin Cherian 2023-12-26
11787008 Chemical mechanical polishing with applied magnetic field Xingfeng Wang, Jianshe Tang, Feng Q. Liu, Stephen Jew 2023-10-17
11791224 Technique for training neural network for use in in-situ monitoring during polishing and polishing system Kun Xu, Kiran Shrestha, Doyle E. Bennett, Benjamin Cherian, Jun Qian +1 more 2023-10-17
11780045 Compensation for substrate doping for in-situ electromagnetic inductive monitoring Wei Lu, Harry Q. Lee, Kun Xu, Jimin Zhang 2023-10-10
11658078 Using a trained neural network for use in in-situ monitoring during polishing and polishing system Kun Xu, Kiran Shrestha, Doyle E. Bennett, Benjamin Cherian, Jun Qian +1 more 2023-05-23
11075165 Methods and apparatus for forming dual metal interconnects Suketu Arun Parikh, Rong Tao, Roey Shaviv, Joung Joo Lee, Seshadri Ganguli +3 more 2021-07-27
10350723 Overpolishing based on electromagnetic inductive monitoring of trench depth Shih-Haur Shen, Jianshe Tang, Jimin Zhang 2019-07-16
9073169 Feedback control of polishing using optical detection of clearance Kun Xu, Ingemar Carlsson, Feng Q. Liu, You Wang, Dominic J. Benvegnu +5 more 2015-07-07