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Slurry distribution device for chemical mechanical polishing |
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Slurry distribution device for chemical mechanical polishing |
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Chemical mechanical polishing with applied magnetic field |
Xingfeng Wang, Jianshe Tang, Feng Q. Liu, David Maxwell Gage |
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Slurry distribution device for chemical mechanical polishing |
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Slurry distribution device for chemical mechanical polishing |
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Endpoint control of multiple substrate zones of varying thickness in chemical mechanical polishing |
Alain Duboust, Wen-Chiang Tu, Shih-Haur Shen, Jimin Zhang, Ingemar Carlsson +4 more |
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Temperature control of chemical mechanical polishing |
Kun Xu, Jimin Zhang, David H. Mai, Shih-Haur Shen, Zhihong Wang +4 more |
2015-04-14 |
| 8694144 |
Endpoint control of multiple substrates of varying thickness on the same platen in chemical mechanical polishing |
Alain Duboust, David H. Mai, Huyen Tran, Wen-Chiang Tu, Shih-Haur Shen +4 more |
2014-04-08 |
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Control of overpolishing of multiple substrates on the same platen in chemical mechanical polishing |
Jimin Zhang, Ingemar Carlsson, Boguslaw A. Swedek |
2013-12-31 |
| 8292691 |
Use of pad conditioning in temperature controlled CMP |
Kun Xu, Thomas H. Osterheld, Jimin Zhang |
2012-10-23 |
| 8295967 |
Endpoint control of multiple-wafer chemical mechanical polishing |
Jimin Zhang, Thomas H. Osterheld, Ingemar Carlsson, Boguslaw A. Swedek |
2012-10-23 |
| 8021211 |
Substrate holder with liquid supporting surface |
Hung Chih Chen, Yin Yuan |
2011-09-20 |
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Travis R. Taylor, Christian DiPietro, Philip Ngoon, Katgenahalli Y. Ramanujam, Tony Luong |
2003-12-23 |
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2001-07-03 |
| 6068539 |
Wafer polishing device with movable window |
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2000-05-30 |