Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Marilyn I. Wright — 25 Patents

AMD: 23 patents #468 of 9,280Top 6%
FSFreeescale Semiconductor: 3 patents #982 of 3,767Top 30%
Motorola: 1 patents #13,418 of 14,142Top 95%
Austin, TX: #1,278 of 18,064 inventorsTop 8%
Texas: #5,166 of 125,132 inventorsTop 5%
Overall (All Time): #158,593 of 4,157,543Top 4%
25 Patents All Time
Marilyn I. Wright has been granted 25 US patents while listed as an inventor at AMD. The first was granted in 2001 and the most recent in October 2011. Marilyn I. Wright ranks #158,593 of 4,157,543 US inventors in our database (top 3.8%). Patent records list Marilyn I. Wright in Austin, TX, US.

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
8039389 Semiconductor device having an organic anti-reflective coating (ARC) and method therefor Douglas M. Reber, Mark D. Hall, Kurt H. Junker, Kyle Patterson, Tab A. Stephens +2 more 2011-10-18 $2,434,000
7861195 Process for design of semiconductor circuits Darin A. Chan, Yi Zou, Yuansheng Ma, Mark W. Michael 2010-12-28 $4,143,000
7262864 Method and apparatus for determining grid dimensions using scatterometry Richard J. Markle, Kevin R. Lensing, J. Broc Stirton 2007-08-28 $7,142,000
7199429 Semiconductor device having an organic anti-reflective coating (ARC) and method therefor Douglas M. Reber, Mark D. Hall, Kurt H. Junker, Kyle Patterson, Tab A. Stephens +2 more 2007-04-03
7109101 Capping layer for reducing amorphous carbon contamination of photoresist in semiconductor device manufacture; and process for making same Srikanteswara Dakshina-Murthy, Kurt H. Junker, Kyle Patterson 2006-09-19
6972255 Semiconductor device having an organic anti-reflective coating (ARC) and method therefor Douglas M. Reber, Mark D. Hall, Kurt H. Junker, Kyle Patterson, Tab A. Stephens +2 more 2005-12-06
6913958 Method for patterning a feature using a trimmed hardmask Marina V. Plat, Chih-Yuh Yang, Douglas J. Bonser 2005-07-05 $11,775,000
6900002 Antireflective bi-layer hardmask including a densified amorphous carbon layer Marina V. Plat, Lu You, Scott A. Bell 2005-05-31 $6,268,000
6893967 L-shaped spacer incorporating or patterned using amorphous carbon or CVD organic materials Douglas J. Bonser, Lu You, Kay Hellig 2005-05-17 $3,810,000
6864556 CVD organic polymer film for advanced gate patterning Lu You, Marina V. Plat, Chih-Yuh Yang, Scott A. Bell, Richard J. Huang +2 more 2005-03-08 $6,020,000
6804014 Method and apparatus for determining contact opening dimensions using scatterometry Richard J. Markle, Kevin R. Lensing, J. Broc Stirton 2004-10-12 $4,245,000
6773939 Method and apparatus for determining critical dimension variation in a line structure 2004-08-10 $1,968,000
6774998 Method and apparatus for identifying misregistration in a complimentary phase shift mask process Kevin R. Lensing, James Broc Stirton 2004-08-10 $1,968,000
6764947 Method for reducing gate line deformation and reducing gate line widths in semiconductor devices Darin A. Chan, Douglas J. Bonser, Marina V. Plat, Chih-Yuh Yang, Lu You +2 more 2004-07-20 $1,607,000
6764949 Method for reducing pattern deformation and photoresist poisoning in semiconductor device fabrication Douglas J. Bonser, Marina V. Plat, Chih-Yuh Yang, Scott A. Bell, Darin A. Chan +6 more 2004-07-20 $1,607,000
6766215 Method and apparatus for detecting necking over field/active transitions Kevin R. Lensing 2004-07-20 $1,607,000
6716646 Method and apparatus for performing overlay measurements using scatterometry Kevin R. Lensing, James Broc Stirton, Richard J. Markle 2004-04-06 $3,021,000
6697153 Method and apparatus for analyzing line structures James Broc Stirton 2004-02-24 $4,069,000
6657716 Method and apparatus for detecting necking over field/active transitions Kevin R. Lensing 2003-12-02 $4,088,000
6650423 Method and apparatus for determining column dimensions using scatterometry Richard J. Markle, Kevin R. Lensing, J. Broc Stirton 2003-11-18 $4,875,000
6509201 Method and apparatus for monitoring wafer stress 2003-01-21 $2,484,000
6479309 Method and apparatus for determining process layer conformality 2002-11-12 $1,765,000
6458610 Method and apparatus for optical film stack fault detection Kevin R. Lensing, James Broc Stirton 2002-10-01 $734,000
6426262 Method of analyzing the effects of shadowing of angled halo implants Mark B. Fuselier, Jon D. Cheek, Frederick N. Hause 2002-07-30 $3,277,000
6261936 Poly gate CD passivation for metrology control Derick J. Wristers, Jon D. Cheek 2001-07-17 $5,113,000