| 7544999 |
SOI semiconductor device having enhanced, self-aligned dielectric regions in the bulk silicon substrate |
Andy Wei, Derick J. Wristers |
2009-06-09 |
| 7432136 |
Transistors with controllable threshold voltages, and various methods of making and operating same |
Derick J. Wristers, Andy Wei |
2008-10-07 |
| 7335568 |
Method of forming doped regions in the bulk substrate of an SOI substrate to control the operational characteristics of transistors formed thereabove, and an integrated circuit device comprising same |
Derick J. Wristers, Andy Wei |
2008-02-26 |
| 7180136 |
Biased, triple-well fully depleted SOI structure |
Andy Wei, Derick J. Wristers |
2007-02-20 |
| 7176095 |
Bi-modal halo implantation |
Akif Sultan, David Wu, Wen-Jie Qi |
2007-02-13 |
| 7129142 |
Method of forming doped regions in the bulk substrate of an SOI substrate to control the operational characteristics of transistors formed thereabove, and an integrated circuit device comprising same |
Derick J. Wristers, Andy Wei |
2006-10-31 |
| 6919236 |
Biased, triple-well fully depleted SOI structure, and various methods of making and operating same |
Andy Wei, Derick J. Wristers |
2005-07-19 |
| 6884702 |
Method of making an SOI semiconductor device having enhanced, self-aligned dielectric regions in the bulk silicon substrate |
Andy Wei, Derick J. Wristers |
2005-04-26 |
| 6876037 |
Fully-depleted SOI device |
Andy Wei, Derick J. Wristers |
2005-04-05 |
| 6806111 |
Semiconductor component and method of manufacture |
Edward E. Ehrichs |
2004-10-19 |
| 6794256 |
Method for asymmetric spacer formation |
Edward E. Ehrichs, S. Doug Ray, Chad Weintraub, James F. Buller |
2004-09-21 |
| 6780686 |
Doping methods for fully-depleted SOI structures, and device comprising the resulting doped regions |
Andy Wei, Derick J. Wristers |
2004-08-24 |
| 6737332 |
Semiconductor device formed over a multiple thickness buried oxide layer, and methods of making same |
Derick J. Wristers, Andy Wei |
2004-05-18 |
| 6583016 |
Doped spacer liner for improved transistor performance |
Andy Wei, Ping-Chin Yeh |
2003-06-24 |
| 6570228 |
Method and apparatus for electrically measuring insulating film thickness |
Roger Thomas Williams, Michael Fenske |
2003-05-27 |
| 6463570 |
Apparatus and method for verifying process integrity |
Michael J. Dunn |
2002-10-08 |
| 6426262 |
Method of analyzing the effects of shadowing of angled halo implants |
Jon D. Cheek, Frederick N. Hause, Marilyn I. Wright |
2002-07-30 |
| 6410350 |
Detecting die speed variations |
Stephen Doug Ray, Michael J. Dunn, Roger Thomas Williams, Michael Fenske |
2002-06-25 |
| 6287877 |
Electrically quantifying transistor spacer width |
Roger Thomas Williams, Michael Fenske |
2001-09-11 |