| 8687417 |
Electronic device and method of biasing |
Ruigang Li, Jingrong Zhou, Zhonghai Shi, James F. Buller, Mark W. Michael +2 more |
2014-04-01 |
$6,826,000 |
| 8546855 |
Charging protection device |
Jingrong Zhou, James F. Buller |
2013-10-01 |
$6,159,000 |
| 8329519 |
Methods for fabricating a semiconductor device having decreased contact resistance |
Zhonghai Shi, Mark W. Michael |
2012-12-11 |
$1,376,000 |
| 8134208 |
Semiconductor device having decreased contact resistance |
Zhonghai Shi, Mark W. Michael |
2012-03-13 |
$9,355,000 |
| 8089125 |
Integrated circuit system with triode |
Jianhong Zhu, Ruigang Li, James F. Buller |
2012-01-03 |
$38,319,000 |
| 8048753 |
Charging protection device |
Jingrong Zhou, James F. Buller |
2011-11-01 |
$1,838,000 |
| 8050077 |
Semiconductor device with transistor-based fuses and related programming method |
Ruigang Li, James F. Buller, Jingrong Zhou |
2011-11-01 |
$1,838,000 |
| 8003466 |
Method of forming multiple fins for a semiconductor device |
Zhonghai Shi, Jingrong Zhou, Ruigang Li |
2011-08-23 |
$5,509,000 |
| 7989891 |
MOS structures with remote contacts and methods for fabricating the same |
Jianhong Zhu, Jinrong ZHOU, James F. Buller |
2011-08-02 |
$7,159,000 |
| 7761838 |
Method for fabricating a semiconductor device having an extended stress liner |
Zhonghai Shi, Mark W. Michael, James F. Buller, Jingrong Zhou, Akif Sultan |
2010-07-20 |
$12,141,000 |
| 7727835 |
SOI device with charging protection and methods of making same |
Jingrong Zhou |
2010-06-01 |
$11,970,000 |
| 7670938 |
Methods of forming contact openings |
Mark W. Michael |
2010-03-02 |
$5,781,000 |
| 7670932 |
MOS structures with contact projections for lower contact resistance and methods for fabricating the same |
Jianhong Zhu, Fred N. Hause |
2010-03-02 |
$5,781,000 |
| 7638837 |
Stress enhanced semiconductor device and methods for fabricating same |
Akif Sultan, Mark W. Michael |
2009-12-29 |
$14,633,000 |
| 7598161 |
Method of forming transistor devices with different threshold voltages using halo implant shadowing |
Jingrong Zhou, Mark W. Michael, James F. Buller, Akif Sultan |
2009-10-06 |
$63,123,000 |
| 7582493 |
Distinguishing between dopant and line width variation components |
Akif Sultan, James F. Buller |
2009-09-01 |
$18,287,000 |
| 7576357 |
System for characterization of low-k dielectric material damage |
Jianhong Zhu |
2009-08-18 |
$20,857,000 |
| 7504270 |
Methods of quantifying variations resulting from manufacturing-induced corner rounding of various features, and structures for testing same |
Mark W. Michael, Akif Sultan, Jingrong Zhou |
2009-03-17 |
$2,427,000 |
| 7482252 |
Method for reducing floating body effects in SOI semiconductor device without degrading mobility |
Qi Xiang, James F. Buller |
2009-01-27 |
$7,357,000 |
| 7414289 |
SOI Device with charging protection and methods of making same |
Jingrong Zhou |
2008-08-19 |
$10,246,000 |
| 7355201 |
Test structure for measuring electrical and dimensional characteristics |
Jianhong Zhu, Mark W. Michael |
2008-04-08 |
$4,787,000 |
| 7271047 |
Test structure and method for measuring the resistance of line-end vias |
Jianhong Zhu, Mark W. Michael |
2007-09-18 |
$10,707,000 |
| 7253045 |
Selective P-channel VT adjustment in SiGe system for leakage optimization |
Derick J. Wristers, Hormuzdiar E. Nariman |
2007-08-07 |
$6,329,000 |
| 7176095 |
Bi-modal halo implantation |
Akif Sultan, Wen-Jie Qi, Mark B. Fuselier |
2007-02-13 |
$17,943,000 |
| 7087509 |
Method of forming a gate electrode on a semiconductor device and a device incorporating same |
William R. Roche, Massud Aminpur, Scott Luning |
2006-08-08 |
$20,246,000 |
