Issued Patents All Time
Showing 25 most recent of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8687417 | Electronic device and method of biasing | Ruigang Li, Jingrong Zhou, Zhonghai Shi, James F. Buller, Mark W. Michael +2 more | 2014-04-01 |
| 8546855 | Charging protection device | Jingrong Zhou, James F. Buller | 2013-10-01 |
| 8329519 | Methods for fabricating a semiconductor device having decreased contact resistance | Zhonghai Shi, Mark W. Michael | 2012-12-11 |
| 8134208 | Semiconductor device having decreased contact resistance | Zhonghai Shi, Mark W. Michael | 2012-03-13 |
| 8089125 | Integrated circuit system with triode | Jianhong Zhu, Ruigang Li, James F. Buller | 2012-01-03 |
| 8048753 | Charging protection device | Jingrong Zhou, James F. Buller | 2011-11-01 |
| 8050077 | Semiconductor device with transistor-based fuses and related programming method | Ruigang Li, James F. Buller, Jingrong Zhou | 2011-11-01 |
| 8003466 | Method of forming multiple fins for a semiconductor device | Zhonghai Shi, Jingrong Zhou, Ruigang Li | 2011-08-23 |
| 7989891 | MOS structures with remote contacts and methods for fabricating the same | Jianhong Zhu, Jinrong ZHOU, James F. Buller | 2011-08-02 |
| 7761838 | Method for fabricating a semiconductor device having an extended stress liner | Zhonghai Shi, Mark W. Michael, James F. Buller, Jingrong Zhou, Akif Sultan | 2010-07-20 |
| 7727835 | SOI device with charging protection and methods of making same | Jingrong Zhou | 2010-06-01 |
| 7670938 | Methods of forming contact openings | Mark W. Michael | 2010-03-02 |
| 7670932 | MOS structures with contact projections for lower contact resistance and methods for fabricating the same | Jianhong Zhu, Fred N. Hause | 2010-03-02 |
| 7638837 | Stress enhanced semiconductor device and methods for fabricating same | Akif Sultan, Mark W. Michael | 2009-12-29 |
| 7598161 | Method of forming transistor devices with different threshold voltages using halo implant shadowing | Jingrong Zhou, Mark W. Michael, James F. Buller, Akif Sultan | 2009-10-06 |
| 7582493 | Distinguishing between dopant and line width variation components | Akif Sultan, James F. Buller | 2009-09-01 |
| 7576357 | System for characterization of low-k dielectric material damage | Jianhong Zhu | 2009-08-18 |
| 7504270 | Methods of quantifying variations resulting from manufacturing-induced corner rounding of various features, and structures for testing same | Mark W. Michael, Akif Sultan, Jingrong Zhou | 2009-03-17 |
| 7482252 | Method for reducing floating body effects in SOI semiconductor device without degrading mobility | Qi Xiang, James F. Buller | 2009-01-27 |
| 7414289 | SOI Device with charging protection and methods of making same | Jingrong Zhou | 2008-08-19 |
| 7355201 | Test structure for measuring electrical and dimensional characteristics | Jianhong Zhu, Mark W. Michael | 2008-04-08 |
| 7271047 | Test structure and method for measuring the resistance of line-end vias | Jianhong Zhu, Mark W. Michael | 2007-09-18 |
| 7253045 | Selective P-channel VT adjustment in SiGe system for leakage optimization | Derick J. Wristers, Hormuzdiar E. Nariman | 2007-08-07 |
| 7176095 | Bi-modal halo implantation | Akif Sultan, Wen-Jie Qi, Mark B. Fuselier | 2007-02-13 |
| 7087509 | Method of forming a gate electrode on a semiconductor device and a device incorporating same | William R. Roche, Massud Aminpur, Scott Luning | 2006-08-08 |