Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9818816 | Metal capacitor design for improved reliability and good electrical connection | James F. Buller | 2017-11-14 |
| 8357584 | Metal capacitor design for improved reliability and good electrical connection | James F. Buller | 2013-01-22 |
| 8089125 | Integrated circuit system with triode | Ruigang Li, James F. Buller, David Wu | 2012-01-03 |
| 7989891 | MOS structures with remote contacts and methods for fabricating the same | Jinrong ZHOU, David Wu, James F. Buller | 2011-08-02 |
| 7807213 | Method and system for characterizing porous materials | Dorel I. Toma | 2010-10-05 |
| 7670932 | MOS structures with contact projections for lower contact resistance and methods for fabricating the same | Fred N. Hause, David Wu | 2010-03-02 |
| 7576357 | System for characterization of low-k dielectric material damage | David Wu | 2009-08-18 |
| 7553769 | Method for treating a dielectric film | Dorel I. Toma, Kazuhiro Hamamoto | 2009-06-30 |
| 7355201 | Test structure for measuring electrical and dimensional characteristics | David Wu, Mark W. Michael | 2008-04-08 |
| 7345000 | Method and system for treating a dielectric film | Robert Matthew Kevwitch, Brandon Hansen, Dorel I. Toma | 2008-03-18 |
| 7271047 | Test structure and method for measuring the resistance of line-end vias | Mark W. Michael, David Wu | 2007-09-18 |
| 7238382 | Method and system for characterizing porous materials | Dorel I. Toma | 2007-07-03 |