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Electronic device and method of biasing |
Ruigang Li, David Wu, Zhonghai Shi, James F. Buller, Mark W. Michael +2 more |
2014-04-01 |
| 8546855 |
Charging protection device |
David Wu, James F. Buller |
2013-10-01 |
| 8048753 |
Charging protection device |
David Wu, James F. Buller |
2011-11-01 |
| 8050077 |
Semiconductor device with transistor-based fuses and related programming method |
Ruigang Li, David Wu, James F. Buller |
2011-11-01 |
| 8026142 |
Method of fabricating semiconductor transistor devices with asymmetric extension and/or halo implants |
Zhonghai Shi |
2011-09-27 |
| 8003466 |
Method of forming multiple fins for a semiconductor device |
Zhonghai Shi, David Wu, Ruigang Li |
2011-08-23 |
| 7793240 |
Compensating for layout dimension effects in semiconductor device modeling |
Akif Sultan, Jian Chen, Mark W. Michael |
2010-09-07 |
| 7761838 |
Method for fabricating a semiconductor device having an extended stress liner |
Zhonghai Shi, Mark W. Michael, David Wu, James F. Buller, Akif Sultan |
2010-07-20 |
| 7727835 |
SOI device with charging protection and methods of making same |
David Wu |
2010-06-01 |
| 7598161 |
Method of forming transistor devices with different threshold voltages using halo implant shadowing |
Mark W. Michael, David Wu, James F. Buller, Akif Sultan |
2009-10-06 |
| 7504270 |
Methods of quantifying variations resulting from manufacturing-induced corner rounding of various features, and structures for testing same |
David Wu, Mark W. Michael, Akif Sultan |
2009-03-17 |
| 7414289 |
SOI Device with charging protection and methods of making same |
David Wu |
2008-08-19 |
