Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7253045 | Selective P-channel VT adjustment in SiGe system for leakage optimization | Derick J. Wristers, David Wu | 2007-08-07 | $6,329,000 |
| 6822260 | Linewidth measurement structure with embedded scatterometry structure | Derick J. Wristers | 2004-11-23 | $3,336,000 |
| 6812506 | Polysilicon linewidth measurement structure with embedded transistor | Derick J. Wristers | 2004-11-02 | $2,431,000 |
| 6801096 | Ring oscillator with embedded scatterometry grate array | Derick J. Wristers, James F. Buller | 2004-10-05 | $3,728,000 |
| 6785009 | Method of using high yielding spectra scatterometry measurements to control semiconductor manufacturing processes, and systems for accomplishing same | James Broc Stirton, Kevin R. Lensing, Steven P. Reeves | 2004-08-31 | $2,273,000 |